Search Results for Microscopy - Narrowed by: Engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026te$003dILS$0026ps$003d300?dt=list
2024-10-08T16:50:23Z
Confocal Raman Microscopy
ent://SD_ILS/0/SD_ILS:192021
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Author Dieing, Thomas. editor. Hollricher, Olaf. editor. Toporski, Jan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-12522-5">http://dx.doi.org/10.1007/978-3-642-12522-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Acoustic Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:333153
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Author Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333153.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Noncontact Atomic Force Microscopy Volume 2
ent://SD_ILS/0/SD_ILS:190017
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Author Morita, Seizo. editor. Giessibl, Franz J. editor. Wiesendanger, Roland. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-01495-6">http://dx.doi.org/10.1007/978-3-642-01495-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Horizons of Applied Scanning Electron Microscopy
ent://SD_ILS/0/SD_ILS:190537
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Author Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03160-1">http://dx.doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology
ent://SD_ILS/0/SD_ILS:190654
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03535-7">http://dx.doi.org/10.1007/978-3-642-03535-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ent://SD_ILS/0/SD_ILS:333137
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333137.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments
ent://SD_ILS/0/SD_ILS:194334
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Author Xie, Hui. author. Onal, Cagdas. author. Régnier, Stéphane. author. Sitti, Metin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-20329-9">http://dx.doi.org/10.1007/978-3-642-20329-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces
ent://SD_ILS/0/SD_ILS:195066
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Author Sadewasser, Sascha. editor. Glatzel, Thilo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22566-6">http://dx.doi.org/10.1007/978-3-642-22566-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ent://SD_ILS/0/SD_ILS:191386
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Encyclopedia of Biophysics
ent://SD_ILS/0/SD_ILS:333072
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Author Roberts, Gordon C. K. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333072.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-16712-6">http://dx.doi.org/10.1007/978-3-642-16712-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High Permittivity Gate Dielectric Materials
ent://SD_ILS/0/SD_ILS:334228
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Author Kar, Samares. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334228.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-36535-5">http://dx.doi.org/10.1007/978-3-642-36535-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Trends in Atomic and Molecular Physics Advanced Technological Applications
ent://SD_ILS/0/SD_ILS:334548
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Author Mohan, Man. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334548.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-38167-6">http://dx.doi.org/10.1007/978-3-642-38167-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
ent://SD_ILS/0/SD_ILS:332321
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Author Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332321.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7675-7">http://dx.doi.org/10.1007/978-1-4614-7675-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
ent://SD_ILS/0/SD_ILS:332776
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Author van Schooten, Kipp. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332776.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>