Search Results for Microscopy - Narrowed by: Semiconductors. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy$0026qf$003dSUBJECT$002509Subject$002509Semiconductors.$002509Semiconductors.$0026ps$003d300? 2024-11-06T11:38:51Z Transmission electron microscopy in micro-nanoelectronics ent://SD_ILS/0/SD_ILS:305423 2024-11-06T11:38:51Z 2024-11-06T11:38:51Z Author&#160;Claverie, A. (Alain)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118579022">http://dx.doi.org/10.1002/9781118579022</a> Safari Books Online <a href="http://proquest.safaribooksonline.com/?fpi=9781118579053">http://proquest.safaribooksonline.com/?fpi=9781118579053</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118579022">http://onlinelibrary.wiley.com/book/10.1002/9781118579022</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118579053">http://proquest.tech.safaribooksonline.de/9781118579053</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance ent://SD_ILS/0/SD_ILS:332776 2024-11-06T11:38:51Z 2024-11-06T11:38:51Z Author&#160;van Schooten, Kipp. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332776.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Resonance Effects of Excitons and Electrons Basics and Applications ent://SD_ILS/0/SD_ILS:334053 2024-11-06T11:38:51Z 2024-11-06T11:38:51Z Author&#160;Geru, Ion. author.&#160;Suter, Dieter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334053.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-35807-4">http://dx.doi.org/10.1007/978-3-642-35807-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>