Search Results for Microscopy - Narrowed by: Solid State Physics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy$0026qf$003dSUBJECT$002509Subject$002509Solid$002bState$002bPhysics.$002509Solid$002bState$002bPhysics.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-25T05:50:34Z Auger- and X-Ray Photoelectron Spectroscopy in Materials Science A User-Oriented Guide ent://SD_ILS/0/SD_ILS:333149 2024-12-25T05:50:34Z 2024-12-25T05:50:34Z Author&#160;Hofmann, Siegfried. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333149.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-27381-0">http://dx.doi.org/10.1007/978-3-642-27381-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High Permittivity Gate Dielectric Materials ent://SD_ILS/0/SD_ILS:334228 2024-12-25T05:50:34Z 2024-12-25T05:50:34Z Author&#160;Kar, Samares. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334228.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-36535-5">http://dx.doi.org/10.1007/978-3-642-36535-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Resonance Effects of Excitons and Electrons Basics and Applications ent://SD_ILS/0/SD_ILS:334053 2024-12-25T05:50:34Z 2024-12-25T05:50:34Z Author&#160;Geru, Ion. author.&#160;Suter, Dieter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334053.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-35807-4">http://dx.doi.org/10.1007/978-3-642-35807-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Science of Solar System Ices ent://SD_ILS/0/SD_ILS:331315 2024-12-25T05:50:34Z 2024-12-25T05:50:34Z Author&#160;Gudipati, Murthy S. editor.&#160;Castillo-Rogez, Julie. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331315.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3076-6">http://dx.doi.org/10.1007/978-1-4614-3076-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transition-Metal Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Si ent://SD_ILS/0/SD_ILS:333931 2024-12-25T05:50:34Z 2024-12-25T05:50:34Z Author&#160;Steger, Michael. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333931.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-35079-5">http://dx.doi.org/10.1007/978-3-642-35079-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Strongly Correlated Systems Numerical Methods ent://SD_ILS/0/SD_ILS:333937 2024-12-25T05:50:34Z 2024-12-25T05:50:34Z Author&#160;Avella, Adolfo. editor.&#160;Mancini, Ferdinando. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333937.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-35106-8">http://dx.doi.org/10.1007/978-3-642-35106-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>