Search Results for Microscopy. - Narrowed by: SpringerLink (Online service) - Online Library - Electronic Library - Nanotechnology.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy.$0026qf$003dAUTHOR$002509Author$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?
2024-09-11T15:18:47Z
Atom Probe Microscopy
ent://SD_ILS/0/SD_ILS:174262
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Author Gault, Baptiste. author. Moody, Michael P. author. Cairney, Julie M. author. Ringer, Simon P. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3436-8">http://dx.doi.org/10.1007/978-1-4614-3436-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Acoustic Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:333153
2024-09-11T15:18:47Z
2024-09-11T15:18:47Z
Author Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333153.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Magnetic Microscopy of Nanostructures
ent://SD_ILS/0/SD_ILS:180864
2024-09-11T15:18:47Z
2024-09-11T15:18:47Z
Author Hopster, Herbert. editor. Oepen, Hans Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137837">http://dx.doi.org/10.1007/b137837</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Helium Ion Microscopy Principles and Applications
ent://SD_ILS/0/SD_ILS:332438
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Author Joy, David C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332438.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8660-2">http://dx.doi.org/10.1007/978-1-4614-8660-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modeling Nanoscale Imaging in Electron Microscopy
ent://SD_ILS/0/SD_ILS:174118
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Author Vogt, Thomas. editor. Dahmen, Wolfgang. editor. Binev, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-2191-7">http://dx.doi.org/10.1007/978-1-4614-2191-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Noncontact Atomic Force Microscopy Volume 2
ent://SD_ILS/0/SD_ILS:190017
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Author Morita, Seizo. editor. Giessibl, Franz J. editor. Wiesendanger, Roland. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-01495-6">http://dx.doi.org/10.1007/978-3-642-01495-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Roadmap of Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:184007
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2024-09-11T15:18:47Z
Author Morita, Seizo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Microscopy for Nanotechnology
ent://SD_ILS/0/SD_ILS:170039
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Author Yao, Nan. editor. Wang, Zhong Lin. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-8006-9">http://dx.doi.org/10.1007/1-4020-8006-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Transmission Electron Microscopy Imaging and Analysis
ent://SD_ILS/0/SD_ILS:172802
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2024-09-11T15:18:47Z
Author Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Horizons of Applied Scanning Electron Microscopy
ent://SD_ILS/0/SD_ILS:190537
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Author Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03160-1">http://dx.doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology
ent://SD_ILS/0/SD_ILS:190654
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03535-7">http://dx.doi.org/10.1007/978-3-642-03535-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Microscopy for Nanotechnology Techniques and Applications
ent://SD_ILS/0/SD_ILS:166275
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Author Zhou, Weilie. editor. Wang, Zhong Lin. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-39620-0">http://dx.doi.org/10.1007/978-0-387-39620-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ent://SD_ILS/0/SD_ILS:333137
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333137.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
ent://SD_ILS/0/SD_ILS:334395
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2024-09-11T15:18:47Z
Author Tang, Dai-Ming. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334395.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37259-9">http://dx.doi.org/10.1007/978-3-642-37259-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ent://SD_ILS/0/SD_ILS:191386
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Coherent Light Microscopy Imaging and Quantitative Phase Analysis
ent://SD_ILS/0/SD_ILS:193093
2024-09-11T15:18:47Z
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Author Ferraro, Pietro. editor. Wax, Adam. editor. Zalevsky, Zeev. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15813-1">http://dx.doi.org/10.1007/978-3-642-15813-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Techniques
ent://SD_ILS/0/SD_ILS:172475
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2024-09-11T15:18:47Z
Author Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Methodology
ent://SD_ILS/0/SD_ILS:168096
2024-09-11T15:18:47Z
2024-09-11T15:18:47Z
Author Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
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2024-09-11T15:18:47Z
Author Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy A Textbook for Materials Science
ent://SD_ILS/0/SD_ILS:167351
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Author Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
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Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
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Author Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-09-11T15:18:47Z
2024-09-11T15:18:47Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
ent://SD_ILS/0/SD_ILS:181752
2024-09-11T15:18:47Z
2024-09-11T15:18:47Z
Author Kaupp, Gerd. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-28472-7">http://dx.doi.org/10.1007/978-3-540-28472-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-09-11T15:18:47Z
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Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
ent://SD_ILS/0/SD_ILS:168790
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Author Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technology
ent://SD_ILS/0/SD_ILS:181232
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Author Yamashita, Mikio. editor. Shigekawa, Hidemi. editor. Morita, Ryuji. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138671">http://dx.doi.org/10.1007/b138671</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
ent://SD_ILS/0/SD_ILS:165220
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Author Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of Solid State Engineering
ent://SD_ILS/0/SD_ILS:486705
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Author Razeghi, Manijeh. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-75708-7">https://doi.org/10.1007/978-3-319-75708-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
ent://SD_ILS/0/SD_ILS:332776
2024-09-11T15:18:47Z
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Author van Schooten, Kipp. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332776.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
UV-VIS and Photoluminescence Spectroscopy for Nanomaterials Characterization
ent://SD_ILS/0/SD_ILS:333157
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Author Kumar, Challa. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333157.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27594-4">http://dx.doi.org/10.1007/978-3-642-27594-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Theory of Bilayer Graphene Spectroscopy
ent://SD_ILS/0/SD_ILS:333374
2024-09-11T15:18:47Z
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Author Mucha-Kruczyński, Marcin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333374.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-30936-6">http://dx.doi.org/10.1007/978-3-642-30936-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Local Electrode Atom Probe Tomography A User's Guide
ent://SD_ILS/0/SD_ILS:332444
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Author Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.<br/>Preferred Shelf Number ONLINE(332444.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8721-0">http://dx.doi.org/10.1007/978-1-4614-8721-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Photoemission Spectroscopy on High Temperature Superconductor A Study of Bi2Sr2CaCu2O8 by Laser-Based Angle-Resolved Photoemission
ent://SD_ILS/0/SD_ILS:333579
2024-09-11T15:18:47Z
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Author Zhang, Wentao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333579.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-32472-7">http://dx.doi.org/10.1007/978-3-642-32472-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
ent://SD_ILS/0/SD_ILS:332321
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Author Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332321.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7675-7">http://dx.doi.org/10.1007/978-1-4614-7675-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanoscience Nanobiotechnology and Nanobiology
ent://SD_ILS/0/SD_ILS:189091
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Author Boisseau, Patrick. editor. Houdy, Philippe. editor. Lahmani, Marcel. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-88633-4">http://dx.doi.org/10.1007/978-3-540-88633-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>