Search Results for Microscopy. - Narrowed by: 2013SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092013$0025092013$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2024-11-08T14:24:04ZAcoustic Scanning Probe Microscopyent://SD_ILS/0/SD_ILS:3331532024-11-08T14:24:04Z2024-11-08T14:24:04ZAuthor Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333153.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical methods in electron microscopyent://SD_ILS/0/SD_ILS:542252024-11-08T14:24:04Z2024-11-08T14:24:04ZAuthor Glauert, Audrey M., ed.<br/>Preferred Shelf Number QH 207 P7 1972- V.1<br/>Format: Books<br/>Availability Health Sciences Library~2<br/>Electron microscopy of cells and tissuesent://SD_ILS/0/SD_ILS:542452024-11-08T14:24:04Z2024-11-08T14:24:04ZAuthor Sjstrand, Fritiof Stig, 1912-<br/>Preferred Shelf Number QH 212.E4 S55 1967 1.K<br/>Format: Books<br/>Availability Health Sciences Library~1<br/>Scanning probe microscopy for energy researchent://SD_ILS/0/SD_ILS:2810952024-11-08T14:24:04Z2024-11-08T14:24:04ZAuthor Bonnell, Dawn A. Kalinin, Sergei V.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564537">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564537</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transmission electron microscopy in micro-nanoelectronicsent://SD_ILS/0/SD_ILS:3054232024-11-08T14:24:04Z2024-11-08T14:24:04ZAuthor Claverie, A. (Alain)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118579022">http://dx.doi.org/10.1002/9781118579022</a>
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Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Sient://SD_ILS/0/SD_ILS:3339312024-11-08T14:24:04Z2024-11-08T14:24:04ZAuthor Steger, Michael. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333931.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-35079-5">http://dx.doi.org/10.1007/978-3-642-35079-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Strongly Correlated Systems Numerical Methodsent://SD_ILS/0/SD_ILS:3339372024-11-08T14:24:04Z2024-11-08T14:24:04ZAuthor Avella, Adolfo. editor. Mancini, Ferdinando. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333937.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-35106-8">http://dx.doi.org/10.1007/978-3-642-35106-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Resonance Effects of Excitons and Electrons Basics and 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