Search Results for Microscopy. - Narrowed by: Semiconductors.
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2024-09-25T11:20:59Z
Transmission electron microscopy in micro-nanoelectronics
ent://SD_ILS/0/SD_ILS:305423
2024-09-25T11:20:59Z
2024-09-25T11:20:59Z
Author Claverie, A. (Alain)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118579022">http://dx.doi.org/10.1002/9781118579022</a>
Safari Books Online <a href="http://proquest.safaribooksonline.com/?fpi=9781118579053">http://proquest.safaribooksonline.com/?fpi=9781118579053</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118579022">http://onlinelibrary.wiley.com/book/10.1002/9781118579022</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118579053">http://proquest.tech.safaribooksonline.de/9781118579053</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Resonance Effects of Excitons and Electrons Basics and Applications
ent://SD_ILS/0/SD_ILS:334053
2024-09-25T11:20:59Z
2024-09-25T11:20:59Z
Author Geru, Ion. author. Suter, Dieter. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334053.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-35807-4">http://dx.doi.org/10.1007/978-3-642-35807-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
ent://SD_ILS/0/SD_ILS:332776
2024-09-25T11:20:59Z
2024-09-25T11:20:59Z
Author van Schooten, Kipp. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332776.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>