Search Results for Microscopy. - Narrowed by: Surfaces (Physics).
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?
2024-09-19T01:44:47Z
Pharmaceutical Microscopy
ent://SD_ILS/0/SD_ILS:173165
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Carlton, Robert Allen. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-8831-7">http://dx.doi.org/10.1007/978-1-4419-8831-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Polymer Microscopy
ent://SD_ILS/0/SD_ILS:166962
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Sawyer, Linda C. author. Grubb, David T. author. Meyers, Gregory F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-72628-1">http://dx.doi.org/10.1007/978-0-387-72628-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Atom Probe Microscopy
ent://SD_ILS/0/SD_ILS:174262
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Gault, Baptiste. author. Moody, Michael P. author. Cairney, Julie M. author. Ringer, Simon P. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3436-8">http://dx.doi.org/10.1007/978-1-4614-3436-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Science of Microscopy
ent://SD_ILS/0/SD_ILS:166500
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Acoustic Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:333153
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333153.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Helium Ion Microscopy Principles and Applications
ent://SD_ILS/0/SD_ILS:332438
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Joy, David C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332438.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8660-2">http://dx.doi.org/10.1007/978-1-4614-8660-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modeling Nanoscale Imaging in Electron Microscopy
ent://SD_ILS/0/SD_ILS:174118
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Vogt, Thomas. editor. Dahmen, Wolfgang. editor. Binev, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-2191-7">http://dx.doi.org/10.1007/978-1-4614-2191-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Roadmap of Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:184007
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Morita, Seizo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Microscopy for Nanotechnology
ent://SD_ILS/0/SD_ILS:170039
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Yao, Nan. editor. Wang, Zhong Lin. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-8006-9">http://dx.doi.org/10.1007/1-4020-8006-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:333265
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333265.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Transmission Electron Microscopy Imaging and Analysis
ent://SD_ILS/0/SD_ILS:172802
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Horizons of Applied Scanning Electron Microscopy
ent://SD_ILS/0/SD_ILS:190537
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03160-1">http://dx.doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:186997
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Microscopy for Nanotechnology Techniques and Applications
ent://SD_ILS/0/SD_ILS:166275
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Zhou, Weilie. editor. Wang, Zhong Lin. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-39620-0">http://dx.doi.org/10.1007/978-0-387-39620-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ent://SD_ILS/0/SD_ILS:333137
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333137.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
ent://SD_ILS/0/SD_ILS:334395
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Tang, Dai-Ming. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334395.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37259-9">http://dx.doi.org/10.1007/978-3-642-37259-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces
ent://SD_ILS/0/SD_ILS:195066
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Sadewasser, Sascha. editor. Glatzel, Thilo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22566-6">http://dx.doi.org/10.1007/978-3-642-22566-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
ent://SD_ILS/0/SD_ILS:172791
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7167-8">http://dx.doi.org/10.1007/978-1-4419-7167-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Coherent Light Microscopy Imaging and Quantitative Phase Analysis
ent://SD_ILS/0/SD_ILS:193093
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Ferraro, Pietro. editor. Wax, Adam. editor. Zalevsky, Zeev. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15813-1">http://dx.doi.org/10.1007/978-3-642-15813-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ent://SD_ILS/0/SD_ILS:191386
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Methodology
ent://SD_ILS/0/SD_ILS:168096
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Techniques
ent://SD_ILS/0/SD_ILS:172475
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ent://SD_ILS/0/SD_ILS:167790
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Echlin, Patrick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy A Textbook for Materials Science
ent://SD_ILS/0/SD_ILS:167351
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy
ent://SD_ILS/0/SD_ILS:187025
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Khulbe, K. C. author. Feng, C. Y. author. Matsuura, Takeshi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73994-4">http://dx.doi.org/10.1007/978-3-540-73994-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
ent://SD_ILS/0/SD_ILS:168790
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
ent://SD_ILS/0/SD_ILS:165220
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Science of Solar System Ices
ent://SD_ILS/0/SD_ILS:331315
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Gudipati, Murthy S. editor. Castillo-Rogez, Julie. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331315.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3076-6">http://dx.doi.org/10.1007/978-1-4614-3076-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
ent://SD_ILS/0/SD_ILS:332321
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332321.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7675-7">http://dx.doi.org/10.1007/978-1-4614-7675-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Local Electrode Atom Probe Tomography A User's Guide
ent://SD_ILS/0/SD_ILS:332444
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.<br/>Preferred Shelf Number ONLINE(332444.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8721-0">http://dx.doi.org/10.1007/978-1-4614-8721-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science A User-Oriented Guide
ent://SD_ILS/0/SD_ILS:333149
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Hofmann, Siegfried. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333149.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27381-0">http://dx.doi.org/10.1007/978-3-642-27381-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Theory of Bilayer Graphene Spectroscopy
ent://SD_ILS/0/SD_ILS:333374
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Mucha-Kruczyński, Marcin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333374.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-30936-6">http://dx.doi.org/10.1007/978-3-642-30936-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ICAME 2011 Proceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011
ent://SD_ILS/0/SD_ILS:335817
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Yoshida, Yutaka. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335817.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-4762-3">http://dx.doi.org/10.1007/978-94-007-4762-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transition-Metal Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Si
ent://SD_ILS/0/SD_ILS:333931
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Steger, Michael. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333931.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-35079-5">http://dx.doi.org/10.1007/978-3-642-35079-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Resonance Effects of Excitons and Electrons Basics and Applications
ent://SD_ILS/0/SD_ILS:334053
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Geru, Ion. author. Suter, Dieter. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334053.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-35807-4">http://dx.doi.org/10.1007/978-3-642-35807-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
HPHT-Treated Diamonds Diamonds Forever
ent://SD_ILS/0/SD_ILS:334441
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Dobrinets, Inga A. author. Vins, Victor. G. author. Zaitsev, Alexander M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334441.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37490-6">http://dx.doi.org/10.1007/978-3-642-37490-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Trends in Atomic and Molecular Physics Advanced Technological Applications
ent://SD_ILS/0/SD_ILS:334548
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Mohan, Man. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334548.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-38167-6">http://dx.doi.org/10.1007/978-3-642-38167-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Radiometry in Modern Scientific Experiments
ent://SD_ILS/0/SD_ILS:197693
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Pravilov, A. M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-7091-0104-9">http://dx.doi.org/10.1007/978-3-7091-0104-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electron Tomography Methods for Three-Dimensional Visualization of Structures in the Cell
ent://SD_ILS/0/SD_ILS:166679
2024-09-19T01:44:47Z
2024-09-19T01:44:47Z
Author Frank, Joachim. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-69008-7">http://dx.doi.org/10.1007/978-0-387-69008-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>