Search Results for Microscopy. - Narrowed by: Transmission electron microscopy.
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Basic techniques for transmission electron microscopy
ent://SD_ILS/0/SD_ILS:251216
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Author Hayat, M. A., 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123339263">http://www.sciencedirect.com/science/book/9780123339263</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission electron microscopy in micro-nanoelectronics
ent://SD_ILS/0/SD_ILS:305423
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Author Claverie, A. (Alain)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118579022">http://dx.doi.org/10.1002/9781118579022</a>
Safari Books Online <a href="http://proquest.safaribooksonline.com/?fpi=9781118579053">http://proquest.safaribooksonline.com/?fpi=9781118579053</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118579022">http://onlinelibrary.wiley.com/book/10.1002/9781118579022</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118579053">http://proquest.tech.safaribooksonline.de/9781118579053</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Aberration-corrected analytical transmission electron microscopy
ent://SD_ILS/0/SD_ILS:304138
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Author Brydson, Rik.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693217">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693217</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781119978848">http://dx.doi.org/10.1002/9781119978848</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Aberration-corrected analytical transmission electron microscopy
ent://SD_ILS/0/SD_ILS:318971
2024-10-01T05:03:06Z
2024-10-01T05:03:06Z
Author Brydson, Rik, editor, author.<br/>Preferred Shelf Number ONLINE(318971.1)<br/>Electronic Access <a href="http://lib.myilibrary.com?id=320457">Connect to MyiLibrary resource.</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=693217">http://public.eblib.com/choice/publicfullrecord.aspx?p=693217</a>
ebrary <a href="http://site.ebrary.com/id/10488537">http://site.ebrary.com/id/10488537</a>
EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781119978848">http://dx.doi.org/10.1002/9781119978848</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to Conventional Transmission Electron Microscopy
ent://SD_ILS/0/SD_ILS:235652
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Author De Graef, Marc.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511615092">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Characterization of radiation-damage by transmission electron microscopy
ent://SD_ILS/0/SD_ILS:275395
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Author Jenkins, M. L., 1949- Kirk, M. A., 1942-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420034646">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>