Search Results for Microstructure -- measurement - Narrowed by: Electronic LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicrostructure$002b--$002bmeasurement$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ic$003dtrue$0026ps$003d300?2024-10-30T14:31:01ZMechanics of residual soilsent://SD_ILS/0/SD_ILS:2909882024-10-30T14:31:01Z2024-10-30T14:31:01ZAuthor Blight, G. E. Leong, E. C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203114704">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nanoscale calibration standards and methods dimensional and related measurements in the micro- and nanometer rangeent://SD_ILS/0/SD_ILS:3021862024-10-30T14:31:01Z2024-10-30T14:31:01ZAuthor Wilkening, Günter. Koenders, Ludger. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0653/2006482032-b.html">http://catdir.loc.gov/catdir/enhancements/fy0653/2006482032-b.html</a>
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