Search Results for Monitoring. - Narrowed by: Nanoscience. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMonitoring.$0026qf$003dSUBJECT$002509Subject$002509Nanoscience.$002509Nanoscience.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-27T04:43:37Z Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System ent://SD_ILS/0/SD_ILS:489259 2024-12-27T04:43:37Z 2024-12-27T04:43:37Z Author&#160;Samukawa, Seiji. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-4-431-54795-2">https://doi.org/10.1007/978-4-431-54795-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Biomedical nanosensors ent://SD_ILS/0/SD_ILS:288150 2024-12-27T04:43:37Z 2024-12-27T04:43:37Z Author&#160;Irudayaraj, Joseph, 1961-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9789814303040">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Life at the nanoscale atomic force microscopy of live cells ent://SD_ILS/0/SD_ILS:290902 2024-12-27T04:43:37Z 2024-12-27T04:43:37Z Author&#160;Dufrn&#778;e, Yves.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9789814267977">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>