Search Results for Mustererkennung. - Narrowed by: English
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMustererkennung.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300?
2026-01-22T19:21:55Z
Pattern recognition : a quality of data perspective
ent://SD_ILS/0/SD_ILS:594118
2026-01-22T19:21:55Z
2026-01-22T19:21:55Z
Author Homenda, Władysław, author. Pedrycz, Witold, 1953- author.<br/>Preferred Shelf Number TK7882 .P3<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119302872">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119302872</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Neural networks for pattern recognition
ent://SD_ILS/0/SD_ILS:220127
2026-01-22T19:21:55Z
2026-01-22T19:21:55Z
Author Nigrin, Albert.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267497">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267497</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Visual reconstruction
ent://SD_ILS/0/SD_ILS:220182
2026-01-22T19:21:55Z
2026-01-22T19:21:55Z
Author Blake, Andrew, 1956- Zisserman, Andrew.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267223">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267223</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer-oriented approaches to pattern recognition
ent://SD_ILS/0/SD_ILS:256668
2026-01-22T19:21:55Z
2026-01-22T19:21:55Z
Author Meisel, William S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124888500">http://www.sciencedirect.com/science/book/9780124888500</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>