Search Results for Nanometrology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNanometrology.$0026ic$003dtrue$0026ps$003d300?dt=list2026-06-04T14:03:02ZHandbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:5420192026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Preferred Shelf Number TA418.7 .W47 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420082029">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:1458162026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Leach, R. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:3557742026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Leach, R. K.<br/>Preferred Shelf Number ONLINE(355774.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:5450512026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Preferred Shelf Number TA418.7 .W45 2003<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420034196">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.ent://SD_ILS/0/SD_ILS:4599652026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Klapetek, Petr.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128133477">https://www.sciencedirect.com/science/book/9780128133477</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturingent://SD_ILS/0/SD_ILS:1762002026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Gao, Wei. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-254-4">http://dx.doi.org/10.1007/978-1-84996-254-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Metrology and Measurement Uncertainty Concepts and Applicationsent://SD_ILS/0/SD_ILS:6083152026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Novellino do Rosario, Pedro Paulo. author. Mendes, Alexandre. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-82303-9">https://doi.org/10.1007/978-3-031-82303-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Metrology Select Proceedings of AdMet 2024ent://SD_ILS/0/SD_ILS:6102372026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Yadav, Sanjay. editor. Garg, Naveen. editor. Kumar, Mukesh. editor. Aggarwal, Shankar G. editor. Jaiswal, Shiv Kumar. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-96-6418-4">https://doi.org/10.1007/978-981-96-6418-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of Metrology and Applicationsent://SD_ILS/0/SD_ILS:5284222026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Global Research and Education: Technological Challenges Proceedings of the 15th International Conference on Global Research and Education Inter-Academia 2016ent://SD_ILS/0/SD_ILS:6120292026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Jabłoński, Ryszard. editor. Szewczyk, Roman. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-46490-9">https://doi.org/10.1007/978-3-319-46490-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advanced Mechatronics Solutionsent://SD_ILS/0/SD_ILS:6150642026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Jabłoński, Ryszard. editor. Brezina, Tomas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-23923-1">https://doi.org/10.1007/978-3-319-23923-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of nanophysics. Principles and methodsent://SD_ILS/0/SD_ILS:5441912026-06-04T14:03:02Z2026-06-04T14:03:02ZAuthor Sattler, Klaus D.<br/>Preferred Shelf Number QC173.4 .M5 H358 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420075410">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>