Search Results for Nanoscience - Narrowed by: Surfaces (Physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNanoscience$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-23T09:48:15Z Nanoscience and Engineering in Superconductivity ent://SD_ILS/0/SD_ILS:192872 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Moshchalkov, Victor. editor.&#160;Woerdenweber, Roger. editor.&#160;Lang, Wolfgang. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15137-8">http://dx.doi.org/10.1007/978-3-642-15137-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 ent://SD_ILS/0/SD_ILS:333137 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333137.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 ent://SD_ILS/0/SD_ILS:191386 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoscience The Science of the Small in Physics, Engineering, Chemistry, Biology and Medicine ent://SD_ILS/0/SD_ILS:191405 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Schaefer, Hans-Eckhardt. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-10559-3">http://dx.doi.org/10.1007/978-3-642-10559-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Acoustic Scanning Probe Microscopy ent://SD_ILS/0/SD_ILS:333153 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Marinello, Francesco. editor.&#160;Passeri, Daniele. editor.&#160;Savio, Enrico. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333153.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications ent://SD_ILS/0/SD_ILS:195203 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Raza, Hassan. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantum Materials, Lateral Semiconductor Nanostructures, Hybrid Systems and Nanocrystals Lateral Semiconductor Nanostructures, Hybrid Systems and Nanocrystals ent://SD_ILS/0/SD_ILS:191403 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Heitmann, Detlef. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-10553-1">http://dx.doi.org/10.1007/978-3-642-10553-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:188564 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. author.&#160;Fuchs, Harald. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XII Characterization ent://SD_ILS/0/SD_ILS:188565 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85039-7">http://dx.doi.org/10.1007/978-3-540-85039-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:188568 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Nanostructures ent://SD_ILS/0/SD_ILS:188013 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bimberg, Dieter. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77899-8">http://dx.doi.org/10.1007/978-3-540-77899-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multiscale Dissipative Mechanisms and Hierarchical Surfaces Friction, Superhydrophobicity, and Biomimetics ent://SD_ILS/0/SD_ILS:188124 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Nosonovsky, Michael. author.&#160;Bhushan, Bharat. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-78425-8">http://dx.doi.org/10.1007/978-3-540-78425-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanostructured Soft Matter Experiment, Theory, Simulation and Perspectives ent://SD_ILS/0/SD_ILS:169762 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Zvelindovsky, Andrei V. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-6330-5">http://dx.doi.org/10.1007/978-1-4020-6330-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:184523 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VI Characterization ent://SD_ILS/0/SD_ILS:184524 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:184525 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanocatalysis ent://SD_ILS/0/SD_ILS:183461 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Heiz, Ulrich. editor.&#160;Landman, Uzi. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-32646-5">http://dx.doi.org/10.1007/978-3-540-32646-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Roadmap of Scanning Probe Microscopy ent://SD_ILS/0/SD_ILS:184007 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Morita, Seizo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of Friction and Wear ent://SD_ILS/0/SD_ILS:184441 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Gnecco, Enrico. editor.&#160;Meyer, Ernst. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-36807-6">http://dx.doi.org/10.1007/978-3-540-36807-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:181412 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods III Characterization ent://SD_ILS/0/SD_ILS:181079 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IV Industrial Applications ent://SD_ILS/0/SD_ILS:181082 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents ent://SD_ILS/0/SD_ILS:166196 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Foster, Adam. author.&#160;Hofer, Werner. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Single Molecule Chemistry and Physics An Introduction ent://SD_ILS/0/SD_ILS:184729 2024-12-23T09:48:15Z 2024-12-23T09:48:15Z Author&#160;Bai, Chunli. author.&#160;Wang, Chen. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-39502-7">http://dx.doi.org/10.1007/978-3-540-39502-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>