Search Results for Nanoscience. - Narrowed by: Chemistry. - Surfaces (Physics).
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNanoscience.$0026qf$003dSUBJECT$002509Subject$002509Chemistry.$002509Chemistry.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026te$003dILS$0026ps$003d300?
2024-09-22T14:32:09Z
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XII Characterization
ent://SD_ILS/0/SD_ILS:188565
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85039-7">http://dx.doi.org/10.1007/978-3-540-85039-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:188568
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multiscale Dissipative Mechanisms and Hierarchical Surfaces Friction, Superhydrophobicity, and Biomimetics
ent://SD_ILS/0/SD_ILS:188124
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Nosonovsky, Michael. author. Bhushan, Bharat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-78425-8">http://dx.doi.org/10.1007/978-3-540-78425-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Nanostructures
ent://SD_ILS/0/SD_ILS:188013
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bimberg, Dieter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-77899-8">http://dx.doi.org/10.1007/978-3-540-77899-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Roadmap of Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:184007
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Morita, Seizo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of Friction and Wear
ent://SD_ILS/0/SD_ILS:184441
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Gnecco, Enrico. editor. Meyer, Ernst. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-36807-6">http://dx.doi.org/10.1007/978-3-540-36807-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanocatalysis
ent://SD_ILS/0/SD_ILS:183461
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Heiz, Ulrich. editor. Landman, Uzi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-32646-5">http://dx.doi.org/10.1007/978-3-540-32646-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VI Characterization
ent://SD_ILS/0/SD_ILS:184524
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:184525
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Single Molecule Chemistry and Physics An Introduction
ent://SD_ILS/0/SD_ILS:184729
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bai, Chunli. author. Wang, Chen. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-39502-7">http://dx.doi.org/10.1007/978-3-540-39502-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-09-22T14:32:09Z
2024-09-22T14:32:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>