Search Results for Nanostructures -- Measurement.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNanostructures$002b--$002bMeasurement.$0026ic$003dtrue$0026ps$003d300?dt=list2026-01-17T01:48:28ZQuantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.ent://SD_ILS/0/SD_ILS:4599652026-01-17T01:48:28Z2026-01-17T01:48:28ZAuthor Klapetek, Petr.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128133477">https://www.sciencedirect.com/science/book/9780128133477</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Proceedings of the 11th European Conference on Thermoelectrics ECT 2013ent://SD_ILS/0/SD_ILS:5307082026-01-17T01:48:28Z2026-01-17T01:48:28ZAuthor Amaldi, Andrea. editor. Tang, Francois. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-07332-3">https://doi.org/10.1007/978-3-319-07332-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Silicon heterostructure handbook : materials, fabrication, devices, circuits, and applications of SiGe and Si strained-layer epitaxyent://SD_ILS/0/SD_ILS:5435052026-01-17T01:48:28Z2026-01-17T01:48:28ZAuthor Cressler, John D.<br/>Preferred Shelf Number TK7871.96 .B55 S55 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420026580">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>