Search Results for Nanotechnology and Microengineering. - Narrowed by: Semiconductors.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNanotechnology$002band$002bMicroengineering.$0026qf$003dSUBJECT$002509Subject$002509Semiconductors.$002509Semiconductors.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?
2024-11-11T22:30:16Z
Aligned Carbon Nanotubes Physics, Concepts, Fabrication and Devices
ent://SD_ILS/0/SD_ILS:333331
2024-11-11T22:30:16Z
2024-11-11T22:30:16Z
Author Ren, Zhifeng. author. Lan, Yucheng. author. Wang, Yang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333331.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-30490-3">http://dx.doi.org/10.1007/978-3-642-30490-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High Mobility and Quantum Well Transistors Design and TCAD Simulation
ent://SD_ILS/0/SD_ILS:336218
2024-11-11T22:30:16Z
2024-11-11T22:30:16Z
Author Hellings, Geert. author. De Meyer, Kristin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(336218.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-6340-1">http://dx.doi.org/10.1007/978-94-007-6340-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
ent://SD_ILS/0/SD_ILS:332776
2024-11-11T22:30:16Z
2024-11-11T22:30:16Z
Author van Schooten, Kipp. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332776.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Toward Quantum FinFET
ent://SD_ILS/0/SD_ILS:332897
2024-11-11T22:30:16Z
2024-11-11T22:30:16Z
Author Han, Weihua. editor. Wang, Zhiming M. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332897.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-02021-1">http://dx.doi.org/10.1007/978-3-319-02021-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
FIB Nanostructures
ent://SD_ILS/0/SD_ILS:332951
2024-11-11T22:30:16Z
2024-11-11T22:30:16Z
Author Wang, Zhiming M. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332951.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-02874-3">http://dx.doi.org/10.1007/978-3-319-02874-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bismuth-Containing Compounds
ent://SD_ILS/0/SD_ILS:332391
2024-11-11T22:30:16Z
2024-11-11T22:30:16Z
Author Li, Handong. editor. Wang, Zhiming M. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332391.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8121-8">http://dx.doi.org/10.1007/978-1-4614-8121-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
ent://SD_ILS/0/SD_ILS:333183
2024-11-11T22:30:16Z
2024-11-11T22:30:16Z
Author Ünlü, Hilmi. editor. Horing, Norman J. M. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333183.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-28424-3">http://dx.doi.org/10.1007/978-3-642-28424-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>