Search Results for Nanotechnology. - Narrowed by: Metrology.
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2025-01-01T05:19:20Z
Metrology and standardization of nanotechnology : protocols and industrial innovations
ent://SD_ILS/0/SD_ILS:424285
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2025-01-01T05:19:20Z
Author Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
2025-01-01T05:19:20Z
2025-01-01T05:19:20Z
Author Leach, R. K.<br/>Preferred Shelf Number ONLINE(355774.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:145816
2025-01-01T05:19:20Z
2025-01-01T05:19:20Z
Author Leach, R. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>