Search Results for Nanotechnology. - Narrowed by: Microscopy.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNanotechnology.$0026qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026ic$003dtrue$0026ps$003d300?
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Fundamentals of Solid State Engineering
ent://SD_ILS/0/SD_ILS:486705
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Author Razeghi, Manijeh. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-75708-7">https://doi.org/10.1007/978-3-319-75708-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical nanoscopy and novel microscopy techniques
ent://SD_ILS/0/SD_ILS:547751
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Author Xi, Peng, editor.<br/>Preferred Shelf Number QH205.2 .O685 2015<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466586307">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Encyclopedia of Biophysics
ent://SD_ILS/0/SD_ILS:333072
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Author Roberts, Gordon C. K. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333072.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-16712-6">http://dx.doi.org/10.1007/978-3-642-16712-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of nanoscopy
ent://SD_ILS/0/SD_ILS:306156
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Author Tendeloo, G. Van (Gustaaf) Van Dyck, Dirk. Pennycook, Stephen J. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527641864">An electronic book accessible through the World Wide Web; click for information</a>
ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10608646">An electronic book accessible through the World Wide Web; click to view</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9783527641864">http://onlinelibrary.wiley.com/book/10.1002/9783527641864</a>
ebrary <a href="http://site.ebrary.com/id/10608646">http://site.ebrary.com/id/10608646</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Coherent Light Microscopy Imaging and Quantitative Phase Analysis
ent://SD_ILS/0/SD_ILS:193093
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Author Ferraro, Pietro. editor. Wax, Adam. editor. Zalevsky, Zeev. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15813-1">http://dx.doi.org/10.1007/978-3-642-15813-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Transmission Electron Microscopy Imaging and Analysis
ent://SD_ILS/0/SD_ILS:172802
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Author Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Methodology
ent://SD_ILS/0/SD_ILS:168096
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Author Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Techniques
ent://SD_ILS/0/SD_ILS:172475
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Author Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanoscience Nanobiotechnology and Nanobiology
ent://SD_ILS/0/SD_ILS:189091
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Author Boisseau, Patrick. editor. Houdy, Philippe. editor. Lahmani, Marcel. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-88633-4">http://dx.doi.org/10.1007/978-3-540-88633-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
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Author Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
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Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
ent://SD_ILS/0/SD_ILS:165220
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Author Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>