Search Results for Nanotechnology. - Narrowed by: Weights and measures. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNanotechnology.$0026qf$003dSUBJECT$002509Subject$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-22T13:10:43Z Particle Size Measurements Fundamentals, Practice, Quality ent://SD_ILS/0/SD_ILS:170410 2024-12-22T13:10:43Z 2024-12-22T13:10:43Z Author&#160;Merkus, Henk G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Vacuum Technology Practice for Scientific Instruments ent://SD_ILS/0/SD_ILS:187153 2024-12-22T13:10:43Z 2024-12-22T13:10:43Z Author&#160;Yoshimura, Nagamitsu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74433-7">http://dx.doi.org/10.1007/978-3-540-74433-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoscale Devices - Fundamentals and Applications ent://SD_ILS/0/SD_ILS:169377 2024-12-22T13:10:43Z 2024-12-22T13:10:43Z Author&#160;Gross, Rudolf. editor.&#160;Sidorenko, Anatolie. editor.&#160;Tagirov, Lenar. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-5107-4">http://dx.doi.org/10.1007/978-1-4020-5107-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY ent://SD_ILS/0/SD_ILS:169412 2024-12-22T13:10:43Z 2024-12-22T13:10:43Z Author&#160;Pertijs, Michiel A.P. author.&#160;Huijsing, Johan H. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-5258-8">http://dx.doi.org/10.1007/1-4020-5258-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Microscale Diagnostic Techniques ent://SD_ILS/0/SD_ILS:180737 2024-12-22T13:10:43Z 2024-12-22T13:10:43Z Author&#160;Breuer, Kenneth S. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b137604">http://dx.doi.org/10.1007/b137604</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integrated Chemical Microsensor Systems in CMOS Technology ent://SD_ILS/0/SD_ILS:181372 2024-12-22T13:10:43Z 2024-12-22T13:10:43Z Author&#160;Hierlemann, Andreas. author.&#160;Baltes, H. editor.&#160;Fujita, Hiroyuki. editor.&#160;Liepmann, Dorian. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>