Search Results for Nondestructive testing -- Congresses.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNondestructive$002btesting$002b--$002bCongresses.$0026te$003dILS$0026ps$003d300?2024-09-17T06:28:52ZEmerging technologies in non-destructive testing V proceedings of the fifth Conference on Emerging Technologies in NDT, Ioannina, Greece, 19-21 September 2011ent://SD_ILS/0/SD_ILS:2900672024-09-17T06:28:52Z2024-09-17T06:28:52ZAuthor International Conference on Emerging Technologies in Non Destructive Testing (5th : 2011 : Ioannina, Greece) Paipetis, Alkis.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203114452">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Non-destructive testing 92 proceedings of the 13th World Conference on Non-Destructive Testing, Sao Paulo, Brazil, 18-23 October 1992ent://SD_ILS/0/SD_ILS:2561012024-09-17T06:28:52Z2024-09-17T06:28:52ZAuthor World Conference on Non-Destructive Testing (13th : 1992 : São Paulo, Brazil) Hallai, C. (Carlos) Kulcsar, P. (Pablo)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444897916">http://www.sciencedirect.com/science/book/9780444897916</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Non-destructive testing proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam, the Netherlands, April 23-28, 1989ent://SD_ILS/0/SD_ILS:2561132024-09-17T06:28:52Z2024-09-17T06:28:52ZAuthor World Conference on Non-Destructive Testing (12th : 1989 : Amsterdam, Netherlands) Boogaard, J. Dijk, G. M. van.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444874504">http://www.sciencedirect.com/science/book/9780444874504</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronics reliability and measurement technology nondestructive evaluationent://SD_ILS/0/SD_ILS:2541512024-09-17T06:28:52Z2024-09-17T06:28:52ZAuthor Heyman, Joseph S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>