Search Results for Nuclear. - Narrowed by: Electronics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNuclear.$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue? 2026-01-22T13:24:19Z Defects in organic semiconductors and devices ent://SD_ILS/0/SD_ILS:598531 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Nguyen, Thien-Phap, author.<br/>Preferred Shelf Number&#160;TK7871.99 .O74 N48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Comparators in Nanometer CMOS Technology ent://SD_ILS/0/SD_ILS:530168 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Goll, Bernhard. author.&#160;Zimmermann, Horst. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-662-44482-5">https://doi.org/10.1007/978-3-662-44482-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics ent://SD_ILS/0/SD_ILS:530446 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Jin, Helena. editor.&#160;Sciammarella, Cesar. editor.&#160;Yoshida, Sanichiro. editor.&#160;Lamberti, Luciano. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-06986-9">https://doi.org/10.1007/978-3-319-06986-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Coronal Mass Ejections An Introduction ent://SD_ILS/0/SD_ILS:173155 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Howard, Timothy. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8789-1">http://dx.doi.org/10.1007/978-1-4419-8789-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of Solid State Engineering ent://SD_ILS/0/SD_ILS:167997 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Razeghi, Manijeh. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-92168-6">http://dx.doi.org/10.1007/978-0-387-92168-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Charged Semiconductor Defects Structure, Thermodynamics and Diffusion ent://SD_ILS/0/SD_ILS:175887 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Seebauer, Edmund G. author.&#160;Kratzer, Meredith C. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-059-3">http://dx.doi.org/10.1007/978-1-84882-059-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Microscopy of Semiconducting Materials 2007 ent://SD_ILS/0/SD_ILS:170247 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Cullis, A. G. editor.&#160;Midgley, P. A. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Particle Detection with Drift Chambers ent://SD_ILS/0/SD_ILS:187654 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Rolandi, Luigi. author.&#160;Riegler, Werner. author.&#160;Blum, Walter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-76684-1">http://dx.doi.org/10.1007/978-3-540-76684-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> History of Semiconductor Engineering ent://SD_ILS/0/SD_ILS:152582 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Lojek, Bo.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-34258-8">http://dx.doi.org/10.1007/978-3-540-34258-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science ent://SD_ILS/0/SD_ILS:166225 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Lang, Sidney B. author.&#160;Chan, Helen L. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-38039-1">http://dx.doi.org/10.1007/978-0-387-38039-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies ent://SD_ILS/0/SD_ILS:169369 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Henzler, Stephan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-5081-X">http://dx.doi.org/10.1007/1-4020-5081-X</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Radiation Effects on Embedded Systems ent://SD_ILS/0/SD_ILS:169551 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;VELAZCO, RAOUL. editor.&#160;FOUILLAT, PASCAL. editor.&#160;REIS, RICARDO. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-5646-8">http://dx.doi.org/10.1007/978-1-4020-5646-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of Nanoscale Film Analysis ent://SD_ILS/0/SD_ILS:165623 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Alford, Terry L. author.&#160;Feldman, Leonard C. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Suhir, E. editor.&#160;Lee, Y. 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P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Physics of Semiconductors An Introduction Including Devices and Nanophysics ent://SD_ILS/0/SD_ILS:184136 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Grundmann, Marius. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-34661-9">http://dx.doi.org/10.1007/3-540-34661-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of Solid State Engineering ent://SD_ILS/0/SD_ILS:165552 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Razeghi, Manijeh. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-28751-5">http://dx.doi.org/10.1007/0-387-28751-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration ent://SD_ILS/0/SD_ILS:165572 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Laconte, J. author.&#160;Flandre, D. author.&#160;Raskin, J. -P. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Low Power VCO Design in CMOS ent://SD_ILS/0/SD_ILS:181967 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Tiebout, Marc. author.&#160;Itoh, Kiyoo. editor.&#160;Lee, Thomas. editor.&#160;Sakurai, Takayasu. editor.&#160;Sansen, Willy M. C. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-29256-X">http://dx.doi.org/10.1007/3-540-29256-X</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoscale Transistors Device Physics, Modeling and Simulation ent://SD_ILS/0/SD_ILS:165457 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Lundstrom, Mark S. author.&#160;Guo, Jing. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Beam Instrumentation and Diagnostics ent://SD_ILS/0/SD_ILS:180705 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Strehl, Peter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-26404-3">http://dx.doi.org/10.1007/3-540-26404-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials for Information Technology Devices, Interconnects and Packaging ent://SD_ILS/0/SD_ILS:175333 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Zschech, Ehrenfried. editor.&#160;Whelan, Caroline. editor.&#160;Mikolajick, Thomas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11&ndash;14, 2005, Oxford, UK ent://SD_ILS/0/SD_ILS:182995 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Cullis, A. G. editor.&#160;Hutchison, J. L. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thin Films and Heterostructures for Oxide Electronics ent://SD_ILS/0/SD_ILS:165225 2026-01-22T13:24:19Z 2026-01-22T13:24:19Z Author&#160;Ogale, Satischandra B. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>