Search Results for Nuclear. - Narrowed by: Surfaces (Physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dNuclear.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ps$003d300? 2026-01-20T23:40:34Z Nuclear Fusion Research Understanding Plasma-Surface Interactions ent://SD_ILS/0/SD_ILS:181362 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Clark, Robert E.H. editor.&#160;Reiter, Detlev H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138970">http://dx.doi.org/10.1007/b138970</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Explosives Detection Using Magnetic and Nuclear Resonance Techniques ent://SD_ILS/0/SD_ILS:204965 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Fraissard, Jacques. editor.&#160;Lapina, Olga. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3062-7">http://dx.doi.org/10.1007/978-90-481-3062-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials for Nuclear Plants From Safe Design to Residual Life Assessments ent://SD_ILS/0/SD_ILS:330890 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Hoffelner, Wolfgang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330890.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2915-8">http://dx.doi.org/10.1007/978-1-4471-2915-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Atomic and Nuclear Analytical Methods XRF, M&ouml;ssbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques ent://SD_ILS/0/SD_ILS:182285 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Verma, H. R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-30279-7">http://dx.doi.org/10.1007/978-3-540-30279-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nuclear Condensed Matter Physics with Synchrotron Radiation Basic Principles, Methodology and Applications ent://SD_ILS/0/SD_ILS:184792 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;R&ouml;hlsberger, Ralf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b86125">http://dx.doi.org/10.1007/b86125</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine ent://SD_ILS/0/SD_ILS:332321 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Fesenko, Olena. editor.&#160;Yatsenko, Leonid. editor.&#160;Brodin, Mikhaylo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332321.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7675-7">http://dx.doi.org/10.1007/978-1-4614-7675-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> M&ouml;ssbauer Spectroscopy Tutorial Book ent://SD_ILS/0/SD_ILS:333541 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Yoshida, Yutaka. editor.&#160;Langouche, Guido. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333541.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32220-4">http://dx.doi.org/10.1007/978-3-642-32220-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ICAME 2011 Proceedings of the 31st International Conference on the Applications of the M&ouml;ssbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011 ent://SD_ILS/0/SD_ILS:335817 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Yoshida, Yutaka. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335817.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-4762-3">http://dx.doi.org/10.1007/978-94-007-4762-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety of VVER-440 Reactors Barriers Against Fission Products Release ent://SD_ILS/0/SD_ILS:176246 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Sluge&#328;, Vladim&iacute;r. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-420-3">http://dx.doi.org/10.1007/978-1-84996-420-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:188564 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. author.&#160;Fuchs, Harald. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:188568 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online 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Electrochemists Toolbox ent://SD_ILS/0/SD_ILS:185266 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Holze, Rudolf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49829-2">http://dx.doi.org/10.1007/978-3-540-49829-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials Handbook A Concise Desktop Reference ent://SD_ILS/0/SD_ILS:175504 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Cardarelli, Francois. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-669-8">http://dx.doi.org/10.1007/978-1-84628-669-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:187050 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;Tomitori, Masahiko. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IX Characterization ent://SD_ILS/0/SD_ILS:187051 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Tomitori, Masahiko. editor.&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods X Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:187052 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Tomitori, Masahiko. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Laser Spectroscopy Vol. 1 Basic Principles ent://SD_ILS/0/SD_ILS:186844 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Demtr&ouml;der, Wolfgang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73418-5">http://dx.doi.org/10.1007/978-3-540-73418-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:186997 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author.&#160;Feldman, Leonard C. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale ent://SD_ILS/0/SD_ILS:165534 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Kalinin, Sergei. editor.&#160;Gruverman, Alexei. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 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C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:166500 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Hawkes, Peter W. editor.&#160;Spence, John C. H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Light Scattering in Solid IX ent://SD_ILS/0/SD_ILS:184056 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Cardona, Manuel. editor.&#160;Merlin, Roberto. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b14231">http://dx.doi.org/10.1007/b14231</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:184523 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VI Characterization ent://SD_ILS/0/SD_ILS:184524 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:184525 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Very High Resolution Photoelectron Spectroscopy ent://SD_ILS/0/SD_ILS:185367 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;H&uuml;fner, Stefan. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-68133-7">http://dx.doi.org/10.1007/3-540-68133-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Slow Heavy-Particle Induced Electron Emission from Solid Surfaces ent://SD_ILS/0/SD_ILS:186047 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Winter, Hannspeter. author.&#160;Burgd&ouml;rfer, Joachim. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-70789-1">http://dx.doi.org/10.1007/3-540-70789-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Planewaves, Pseudopotentials and the LAPW Method ent://SD_ILS/0/SD_ILS:165667 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Singh, David J. author.&#160;Nordstr&ouml;m, Lars. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29684-5">http://dx.doi.org/10.1007/978-0-387-29684-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Residual Stress and Its Effects on Fatigue and Fracture Proceedings of a Special Symposium held within the 16th European Conference of Fracture &ndash; ECF16, Alexandroupolis, Greece, 3-7 July 2006 ent://SD_ILS/0/SD_ILS:169436 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Youtsos, A.G. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-5329-0">http://dx.doi.org/10.1007/1-4020-5329-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration ent://SD_ILS/0/SD_ILS:165572 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Laconte, J. author.&#160;Flandre, D. author.&#160;Raskin, J. -P. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods III Characterization ent://SD_ILS/0/SD_ILS:181079 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IV Industrial Applications ent://SD_ILS/0/SD_ILS:181082 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:181412 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering ent://SD_ILS/0/SD_ILS:181566 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Lecoq, Paul. author.&#160;Annenkov, Alexander. author.&#160;Gektin, Alexander. author.&#160;Korzhik, Mikhail. author.&#160;Pedrini, Christian. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-27768-4">http://dx.doi.org/10.1007/3-540-27768-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metalle Struktur und Eigenschaften der Metalle und Legierungen ent://SD_ILS/0/SD_ILS:183904 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Hornbogen, Erhard. author.&#160;Warlimont, Hans. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-34011-4">http://dx.doi.org/10.1007/3-540-34011-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of Practical X-Ray Fluorescence Analysis ent://SD_ILS/0/SD_ILS:184419 2026-01-20T23:40:34Z 2026-01-20T23:40:34Z Author&#160;Beckhoff, Burkhard. editor.&#160;Kanngie&szlig;er, habil. 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