Search Results for Operating Systems. - Narrowed by: Systems engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dOperating$002bSystems.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026pe$003dd$00253A$0026ic$003dtrue$0026ps$003d300?dt=list 2024-12-29T06:16:44Z Sistem ve network m&uuml;hendisli&#287;i ent://SD_ILS/0/SD_ILS:514249 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;K&#305;rba&#351;, Kayhan.<br/>Preferred Shelf Number&#160;QA76.76.O63 K463 2021<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Sistem ve network m&uuml;hendisli&#287;i ent://SD_ILS/0/SD_ILS:524405 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;K&#305;rba&#351;, Kayhan.&#160;Soylu, &#304;rem.<br/>Preferred Shelf Number&#160;QA76.76.O63 K463 2021<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> The Hardware Trojan War Attacks, Myths, and Defenses ent://SD_ILS/0/SD_ILS:400849 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Bhunia, Swarup. editor.&#160;Tehranipoor, Mark M. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-68511-3">https://doi.org/10.1007/978-3-319-68511-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip ent://SD_ILS/0/SD_ILS:401348 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Wang, Zheng. author.&#160;Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses ent://SD_ILS/0/SD_ILS:401188 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Kochs, Hans-Dieter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-64991-7">https://doi.org/10.1007/978-3-319-64991-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Low-Power Design and Power-Aware Verification ent://SD_ILS/0/SD_ILS:402053 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Khondkar, Progyna. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-66619-8">https://doi.org/10.1007/978-3-319-66619-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dependable Multicore Architectures at Nanoscale ent://SD_ILS/0/SD_ILS:402190 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Ottavi, Marco. editor.&#160;Gizopoulos, Dimitris. editor.&#160;Pontarelli, Salvatore. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-54422-9">https://doi.org/10.1007/978-3-319-54422-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design, Analysis and Test of Logic Circuits Under Uncertainty ent://SD_ILS/0/SD_ILS:335669 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Krishnaswamy, Smita. author.&#160;Markov, Igor L. author.&#160;Hayes, John P. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335669.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault-Tolerant Design ent://SD_ILS/0/SD_ILS:331297 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Dubrova, Elena. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331297.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-2113-9">http://dx.doi.org/10.1007/978-1-4614-2113-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Test and Diagnosis for Small-Delay Defects ent://SD_ILS/0/SD_ILS:173108 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Tehranipoor, Mohammad. author.&#160;Peng, Ke. author.&#160;Chakrabarty, Krishnendu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Soft Errors in Modern Electronic Systems ent://SD_ILS/0/SD_ILS:172744 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Nicolaidis, Michael. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Predictive Technology Model for Robust Nanoelectronic Design ent://SD_ILS/0/SD_ILS:173686 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Cao, Yu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0445-3">http://dx.doi.org/10.1007/978-1-4614-0445-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VLSI 2010 Annual Symposium Selected papers ent://SD_ILS/0/SD_ILS:206081 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Voros, Nikolaos. editor.&#160;Mukherjee, Amar. editor.&#160;Sklavos, Nicolas. editor.&#160;Masselos, Konstantinos. editor.&#160;Huebner, Michael. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-1488-5">http://dx.doi.org/10.1007/978-94-007-1488-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault ent://SD_ILS/0/SD_ILS:205032 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Wunderlich, Hans-Joachim. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3282-9">http://dx.doi.org/10.1007/978-90-481-3282-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Gizopoulos / Advances in ElectronicTesting ent://SD_ILS/0/SD_ILS:165642 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Gizopoulos, Dimitris. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software-Implemented Hardware Fault Tolerance ent://SD_ILS/0/SD_ILS:165890 2024-12-29T06:16:44Z 2024-12-29T06:16:44Z Author&#160;Goloubeva, Olga. author.&#160;Rebaudengo, Maurizio. author.&#160;Reorda, Matteo Sonza. author.&#160;Violante, Massimo. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf 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