Search Results for Optical Metrology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dOptical$002bMetrology.$0026ps$003d300?dt=list
2026-01-19T16:33:46Z
Optical metrology
ent://SD_ILS/0/SD_ILS:318819
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Gåsvik, Kjell J.<br/>Preferred Shelf Number ONLINE(318819.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534</a>
MyiLibrary <a href="http://www.myilibrary.com?id=26972">http://www.myilibrary.com?id=26972</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a>
Table of contents <a href="http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html">http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical metrology
ent://SD_ILS/0/SD_ILS:301055
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Gåsvik, Kjell J. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
INTRODUCTION TO OPTICAL METROLOGY
ent://SD_ILS/0/SD_ILS:557177
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Sirohi, R. S.<br/>Preferred Shelf Number QC367<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003531845">https://www.taylorfrancis.com/books/9781003531845</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of optical dimensional metrology
ent://SD_ILS/0/SD_ILS:542598
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Harding, Kevin G.<br/>Preferred Shelf Number T50 .H268 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439854822">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Optical imaging and metrology advanced technologies
ent://SD_ILS/0/SD_ILS:306211
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Osten, Wolfgang. Reingand, Nadya.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916</a>
Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of optical metrology : principles and applications
ent://SD_ILS/0/SD_ILS:540970
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Yoshizawa, Toru, 1939-<br/>Preferred Shelf Number QC367 .H36 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420019513">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
ent://SD_ILS/0/SD_ILS:487840
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Osten, Wolfgang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
ent://SD_ILS/0/SD_ILS:342225
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Preferred Shelf Number ONLINE(342225.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
ebrary <a href="http://site.ebrary.com/id/10881255">http://site.ebrary.com/id/10881255</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a>
MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of 3D machine vision : optical metrology and imaging
ent://SD_ILS/0/SD_ILS:538624
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Song, Zhang.<br/>Preferred Shelf Number TK8315 .H36 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439872208">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
A practical guide to optical metrology for thin films
ent://SD_ILS/0/SD_ILS:306262
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Quinten, Michael.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1037093">Click here to view book</a>
<a href="http://lib.myilibrary.com?id=478849">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
ent://SD_ILS/0/SD_ILS:173624
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Proulx, Tom. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fringe 2009 6th International Workshop on Advanced Optical Metrology
ent://SD_ILS/0/SD_ILS:190503
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03051-2">http://dx.doi.org/10.1007/978-3-642-03051-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
ent://SD_ILS/0/SD_ILS:527380
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Di Maio, Dario. editor. Baqersad, Javad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-04098-6">https://doi.org/10.1007/978-3-031-04098-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Metrology and Applications
ent://SD_ILS/0/SD_ILS:528422
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
ent://SD_ILS/0/SD_ILS:518392
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Microstructuring of Thermo-Mechanically Highly Stressed Surfaces Final Report of the DFG Research Group 576
ent://SD_ILS/0/SD_ILS:529441
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Denkena, Berend. editor. Rienäcker, Adrian. editor. Knoll, Gunter. editor. Bach, Friedrich-Wilhelm. editor. Maier, Hans Jürgen. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-09692-6">https://doi.org/10.1007/978-3-319-09692-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical devices in ophthalmology and optometry technology, design principles and clinical applications
ent://SD_ILS/0/SD_ILS:342196
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.<br/>Preferred Shelf Number ONLINE(342196.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527648962">http://dx.doi.org/10.1002/9783527648962</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of photonics for biomedical science
ent://SD_ILS/0/SD_ILS:547675
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Tuchin, V. V. (Valerii Viktorovich)<br/>Preferred Shelf Number R857 .O6 H366 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439806296">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of semiconductor manufacturing technology
ent://SD_ILS/0/SD_ILS:542441
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Doering, Robert, 1946- Nishi, Yoshio, 1940-<br/>Preferred Shelf Number TK7871.85 .H3335 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Microlithography : science and technology
ent://SD_ILS/0/SD_ILS:542483
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Suzuki, Kazuaki. Smith, Bruce W., 1959-<br/>Preferred Shelf Number TK7836 .M525 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420051537">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Optical inspection of microsystems
ent://SD_ILS/0/SD_ILS:542500
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Osten, Wolfgang.<br/>Preferred Shelf Number TS156.2 .O652 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420019162">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Solid-state lasers and applications
ent://SD_ILS/0/SD_ILS:544504
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Sennaroglu, Alphan.<br/>Preferred Shelf Number TA1705 .S6748 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315222059">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of photomask manufacturing technology
ent://SD_ILS/0/SD_ILS:546491
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Rizvi, Syed.<br/>Preferred Shelf Number TK7872 .M3 H36 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420028782">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of Laser Technology and Applications (Three- Volume Set).
ent://SD_ILS/0/SD_ILS:541050
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Taylor and Francis.<br/>Preferred Shelf Number TA1675 .H363 2003<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/e/9781420050530">Click here to view.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of optical engineering
ent://SD_ILS/0/SD_ILS:542246
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Malacara, Daniel, 1937- Thompson, Brian J.<br/>Preferred Shelf Number TA1520 .H368 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135556525">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of silicon semiconductor metrology
ent://SD_ILS/0/SD_ILS:547244
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Diebold, A. C. (Alain C.)<br/>Preferred Shelf Number TK7871.85 .H3337 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Assessment of Oral Health : Diagnostic Techniques and Validation Criteria
ent://SD_ILS/0/SD_ILS:548684
2026-01-19T16:33:46Z
2026-01-19T16:33:46Z
Author Faller, R.V., editor.<br/>Preferred Shelf Number XX(548684.1)<br/>Electronic Access <a href="https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3">https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>