Search Results for Optical materials. - Narrowed by: Spectrum analysis. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dOptical$002bmaterials.$0026qf$003dSUBJECT$002509Subject$002509Spectrum$002banalysis.$002509Spectrum$002banalysis.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue? 2024-11-15T23:24:03Z Optical techniques for solid-state materials characterization ent://SD_ILS/0/SD_ILS:286988 2024-11-15T23:24:03Z 2024-11-15T23:24:03Z Author&#160;Prasankumar, Rohit P.&#160;Taylor, Antoinette J., 1956-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439814376">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Kramers-Kronig Relations in Optical Materials Research ent://SD_ILS/0/SD_ILS:181329 2024-11-15T23:24:03Z 2024-11-15T23:24:03Z Author&#160;Lucarini, Valerio. author.&#160;Peiponen, Kai-Erik. author.&#160;Saarinen, Jarkko J. author.&#160;Vartiainen, Erik M. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138913">http://dx.doi.org/10.1007/b138913</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Optics ent://SD_ILS/0/SD_ILS:184678 2024-11-15T23:24:03Z 2024-11-15T23:24:03Z Author&#160;Klingshirn, Claus. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-38347-5">http://dx.doi.org/10.1007/978-3-540-38347-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spectroscopic ellipsometry principles and applications ent://SD_ILS/0/SD_ILS:296817 2024-11-15T23:24:03Z 2024-11-15T23:24:03Z Author&#160;Fujiwara, Hiroyuki.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060193">http://dx.doi.org/10.1002/9780470060193</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms ent://SD_ILS/0/SD_ILS:181391 2024-11-15T23:24:03Z 2024-11-15T23:24:03Z Author&#160;Li, Flora M. author.&#160;Nathan, Arokia. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Optics ent://SD_ILS/0/SD_ILS:181030 2024-11-15T23:24:03Z 2024-11-15T23:24:03Z Author&#160;Klingshirn, Claus. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138175">http://dx.doi.org/10.1007/b138175</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Physics of Thin Film Optical Spectra An Introduction ent://SD_ILS/0/SD_ILS:181597 2024-11-15T23:24:03Z 2024-11-15T23:24:03Z Author&#160;Stenzel, Olaf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-27905-9">http://dx.doi.org/10.1007/3-540-27905-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>