Search Results for Optical materials. - Narrowed by: Spectrum analysis.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dOptical$002bmaterials.$0026qf$003dSUBJECT$002509Subject$002509Spectrum$002banalysis.$002509Spectrum$002banalysis.$0026pe$003dd$00253A$0026ps$003d300?dt=list
2024-12-27T12:45:04Z
Optical techniques for solid-state materials characterization
ent://SD_ILS/0/SD_ILS:286988
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Author Prasankumar, Rohit P. Taylor, Antoinette J., 1956-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439814376">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Kramers-Kronig Relations in Optical Materials Research
ent://SD_ILS/0/SD_ILS:181329
2024-12-27T12:45:04Z
2024-12-27T12:45:04Z
Author Lucarini, Valerio. author. Peiponen, Kai-Erik. author. Saarinen, Jarkko J. author. Vartiainen, Erik M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138913">http://dx.doi.org/10.1007/b138913</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Spectroscopic ellipsometry principles and applications
ent://SD_ILS/0/SD_ILS:296817
2024-12-27T12:45:04Z
2024-12-27T12:45:04Z
Author Fujiwara, Hiroyuki. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470060193">http://dx.doi.org/10.1002/9780470060193</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Optics
ent://SD_ILS/0/SD_ILS:184678
2024-12-27T12:45:04Z
2024-12-27T12:45:04Z
Author Klingshirn, Claus. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-38347-5">http://dx.doi.org/10.1007/978-3-540-38347-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Optics
ent://SD_ILS/0/SD_ILS:181030
2024-12-27T12:45:04Z
2024-12-27T12:45:04Z
Author Klingshirn, Claus. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138175">http://dx.doi.org/10.1007/b138175</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
ent://SD_ILS/0/SD_ILS:181391
2024-12-27T12:45:04Z
2024-12-27T12:45:04Z
Author Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Physics of Thin Film Optical Spectra An Introduction
ent://SD_ILS/0/SD_ILS:181597
2024-12-27T12:45:04Z
2024-12-27T12:45:04Z
Author Stenzel, Olaf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-27905-9">http://dx.doi.org/10.1007/3-540-27905-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>