Search Results for Optical measurements. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dOptical$002bmeasurements.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-22T23:54:37Z Optical radiation measurements ent://SD_ILS/0/SD_ILS:257787 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Grum, Franc C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123049018">http://www.sciencedirect.com/science/book/9780123049018</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical radiometry for ocean climate measurements ent://SD_ILS/0/SD_ILS:355415 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Zibordi, Giuseppe, editor of compilation.&#160;Donlon, Craig J., editor of compilation.&#160;Parr, A. C. (Albert C.), editor of compilation.<br/>Preferred Shelf Number&#160;ONLINE(355415.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124170117">http://www.sciencedirect.com/science/book/9780124170117</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Principles of optical fiber measurements ent://SD_ILS/0/SD_ILS:254946 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Marcuse, Dietrich, 1929-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124709805">http://www.sciencedirect.com/science/book/9780124709805</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spectrophotometry, luminescence, and colour science &amp; compliance : papers presented at the second joint meeting of the UV Spectrometry Group of the UK and the Council for Optical Radiation Measurements of the USA, Rindge, New Hampshire, USA, June 20-23, 1994 ent://SD_ILS/0/SD_ILS:252681 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Burgess, C. (Christopher)&#160;Jones, D. G. (Dianna G.)&#160;Ultraviolet Spectrometry Group (Great Britain)&#160;Council for Optical Radiation Measurements (U.S.)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444817181">http://www.sciencedirect.com/science/book/9780444817181</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in standards and methodology in spectrophotometry papers presented at the first joint meeting of the UV Spectrometry Group of the U.K. and the Council for Optical Radiation Measurements of the U.S.A., Oxford, September 14-17, 1986 ent://SD_ILS/0/SD_ILS:252367 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Burgess, C. (Christopher)&#160;Mielenz, K. D.&#160;Ultraviolet Spectrometry Group (Great Britain)&#160;Council for Optical Radiation Measurements (U.S.)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444428806">http://www.sciencedirect.com/science/book/9780444428806</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical Waveguiding and Applied Photonics Technological Aspects, Experimental Issue Approaches and Measurements ent://SD_ILS/0/SD_ILS:331909 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Lay-Ekuakille, Aim&eacute;. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331909.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-5959-0">http://dx.doi.org/10.1007/978-1-4614-5959-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Photometry, Radiometry, and Measurements of Optical Losses ent://SD_ILS/0/SD_ILS:206281 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Bukshtab, Michael. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-2165-4">http://dx.doi.org/10.1007/978-94-007-2165-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics ent://SD_ILS/0/SD_ILS:173624 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Proulx, Tom. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Phase estimation in optical interferometry ent://SD_ILS/0/SD_ILS:356750 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Rastogi, Pramod K., 1951- editor.&#160;Hack, Erwin, editor.<br/>Preferred Shelf Number&#160;ONLINE(356750.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781466598324">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Vision -- ACCV 2014 12th Asian Conference on Computer Vision, Singapore, Singapore, November 1-5, 2014, Revised Selected Papers, Part V ent://SD_ILS/0/SD_ILS:518909 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Cremers, Daniel. editor.&#160;Reid, Ian. editor.&#160;Saito, Hideo. editor.&#160;Yang, Ming-Hsuan. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(518909.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-16814-2">https://doi.org/10.1007/978-3-319-16814-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fringe pattern analysis for optical metrology : theory, algorithms, and applications ent://SD_ILS/0/SD_ILS:342225 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Serv&iacute;n, Manuel, author.&#160;Quiroga, J. Antonio (Juan Antonio), author.&#160;Padilla, J. Mois&eacute;s (Jos&eacute; Mois&eacute;s), author.<br/>Preferred Shelf Number&#160;ONLINE(342225.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a> ebrary <a href="http://site.ebrary.com/id/10881255">http://site.ebrary.com/id/10881255</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a> MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical magnetometry ent://SD_ILS/0/SD_ILS:279535 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Budker, Dmitry.&#160;Jackson Kimball, Derek F.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=529666">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=529666</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of optical dimensional metrology ent://SD_ILS/0/SD_ILS:289968 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Harding, Kevin G.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439854822">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical techniques for solid-state materials characterization ent://SD_ILS/0/SD_ILS:286988 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Prasankumar, Rohit P.&#160;Taylor, Antoinette J., 1956-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439814376">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical imaging and metrology advanced technologies ent://SD_ILS/0/SD_ILS:306211 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Osten, Wolfgang.&#160;Reingand, Nadya.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916</a> Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical methods for solid mechanics : a full-field approach ent://SD_ILS/0/SD_ILS:248688 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Rastogi, P. 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Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Diffuse optical tomography principles and applications ent://SD_ILS/0/SD_ILS:288860 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Jiang, Huabei.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439847589">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Life at the nanoscale atomic force microscopy of live cells ent://SD_ILS/0/SD_ILS:290902 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Dufrn&#778;e, Yves.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9789814267977">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Specular gloss ent://SD_ILS/0/SD_ILS:148646 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Silvennoinen, Raimo.&#160;Peiponen, K.-E (Kai-Erik), 1954-&#160;Myller, Kari.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080453149">http://www.sciencedirect.com/science/book/9780080453149</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of optical sensing of glucose in biological fluids and tissues ent://SD_ILS/0/SD_ILS:290019 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Tuchin, V. V. (Valeri? Viktorovich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781584889755">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical shop testing ent://SD_ILS/0/SD_ILS:296984 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Malacara, Daniel, 1937-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470135976">http://dx.doi.org/10.1002/9780470135976</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Interferogram analysis for optical testing ent://SD_ILS/0/SD_ILS:288501 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Malacara, Daniel, 1937-&#160;Servn&#789;, Manuel.&#160;Malacara, Zacarias, 1948-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420027273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical metrology ent://SD_ILS/0/SD_ILS:301055 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;G&aring;svik, Kjell J.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical metrology ent://SD_ILS/0/SD_ILS:318819 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;G&aring;svik, Kjell J.<br/>Preferred Shelf Number&#160;ONLINE(318819.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a> EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534</a> MyiLibrary <a href="http://www.myilibrary.com?id=26972">http://www.myilibrary.com?id=26972</a> John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a> Table of contents <a href="http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html">http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Adaptive optics engineering handbook ent://SD_ILS/0/SD_ILS:284654 2024-12-22T23:54:37Z 2024-12-22T23:54:37Z Author&#160;Tyson, Robert K., 1948-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203908686">Distributed by publisher. 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