Search Results for Particles (Nuclear physics) - Narrowed by: Electronics.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dParticles$002b$002528Nuclear$002bphysics$002529$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ic$003dtrue$0026ps$003d300?2024-11-06T02:07:10ZFundamentals of Solid State Engineeringent://SD_ILS/0/SD_ILS:1679972024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Razeghi, Manijeh. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-92168-6">http://dx.doi.org/10.1007/978-0-387-92168-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Charged Semiconductor Defects Structure, Thermodynamics and Diffusionent://SD_ILS/0/SD_ILS:1758872024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Seebauer, Edmund G. author. Kratzer, Meredith C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84882-059-3">http://dx.doi.org/10.1007/978-1-84882-059-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microscopy of Semiconducting Materials 2007ent://SD_ILS/0/SD_ILS:1702472024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:1659002024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of Nanoscale Film Analysisent://SD_ILS/0/SD_ILS:1656232024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Scienceent://SD_ILS/0/SD_ILS:1662252024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Lang, Sidney B. author. Chan, Helen L. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38039-1">http://dx.doi.org/10.1007/978-0-387-38039-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologiesent://SD_ILS/0/SD_ILS:1693692024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Henzler, Stephan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5081-X">http://dx.doi.org/10.1007/1-4020-5081-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>History of Semiconductor Engineeringent://SD_ILS/0/SD_ILS:1525822024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Lojek, Bo. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34258-8">http://dx.doi.org/10.1007/978-3-540-34258-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nanoscale Transistors Device Physics, Modeling and Simulationent://SD_ILS/0/SD_ILS:1654572024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micromachined Thin-Film Sensors for SOI-CMOS Co-Integrationent://SD_ILS/0/SD_ILS:1655722024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Laconte, J. author. Flandre, D. author. Raskin, J. -P. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of Solid State Engineeringent://SD_ILS/0/SD_ILS:1655522024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Razeghi, Manijeh. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-28751-5">http://dx.doi.org/10.1007/0-387-28751-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Physics of Semiconductors An Introduction Including Devices and Nanophysicsent://SD_ILS/0/SD_ILS:1841362024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Grundmann, Marius. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-34661-9">http://dx.doi.org/10.1007/3-540-34661-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Low Power VCO Design in CMOSent://SD_ILS/0/SD_ILS:1819672024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Tiebout, Marc. author. Itoh, Kiyoo. editor. Lee, Thomas. editor. Sakurai, Takayasu. editor. Sansen, Willy M. C. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-29256-X">http://dx.doi.org/10.1007/3-540-29256-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Thin Films and Heterostructures for Oxide Electronicsent://SD_ILS/0/SD_ILS:1652252024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Ogale, Satischandra B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Materials for Information Technology Devices, Interconnects and Packagingent://SD_ILS/0/SD_ILS:1753332024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Zschech, Ehrenfried. editor. Whelan, Caroline. editor. Mikolajick, Thomas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:1829952024-11-06T02:07:10Z2024-11-06T02:07:10ZAuthor Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>