Search Results for Particles (Nuclear physics) - Narrowed by: Nanotechnology. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dParticles$002b$002528Nuclear$002bphysics$002529$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026te$003dILS$0026ps$003d300? 2024-11-15T09:14:44Z Electron Transport in Nanosystems ent://SD_ILS/0/SD_ILS:170453 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Bon&#269;a, Janez. editor.&#160;Kruchinin, Sergei. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-9146-9">http://dx.doi.org/10.1007/978-1-4020-9146-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantenphysik in der Nanowelt Schr&ouml;dingers Katze bei den Zwergen ent://SD_ILS/0/SD_ILS:186155 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;L&uuml;th, Hans. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-71043-1">http://dx.doi.org/10.1007/978-3-540-71043-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:188564 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Bhushan, Bharat. author.&#160;Fuchs, Harald. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:188568 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Single Semiconductor Quantum Dots ent://SD_ILS/0/SD_ILS:188849 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Michler, Peter. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-87446-1">http://dx.doi.org/10.1007/978-3-540-87446-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solid State Gas Sensing ent://SD_ILS/0/SD_ILS:164739 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Comini, Elisabetta. editor.&#160;Faglia, Guido. editor.&#160;Sberveglieri, Giorgio. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-09665-0">http://dx.doi.org/10.1007/978-0-387-09665-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of Solid State Engineering ent://SD_ILS/0/SD_ILS:167997 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Razeghi, Manijeh. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-92168-6">http://dx.doi.org/10.1007/978-0-387-92168-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:187050 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;Tomitori, Masahiko. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IX Characterization ent://SD_ILS/0/SD_ILS:187051 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Tomitori, Masahiko. editor.&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods X Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:187052 2024-11-15T09:14:44Z 2024-11-15T09:14:44Z Author&#160;Bhushan, Bharat. editor.&#160;Tomitori, Masahiko. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf 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