Search Results for Particles (Nuclear physics) - Narrowed by: Surfaces (Physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dParticles$002b$002528Nuclear$002bphysics$002529$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ic$003dtrue$0026ps$003d300? 2024-12-04T09:35:02Z X-ray and Neutron Reflectivity Principles and Applications ent://SD_ILS/0/SD_ILS:189083 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Daillant, Jean. editor.&#160;Gibaud, Alain. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-88588-7">http://dx.doi.org/10.1007/978-3-540-88588-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:188564 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Bhushan, Bharat. author.&#160;Fuchs, Harald. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:188568 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mikro- und Nanoskopie der Werkstoffe ent://SD_ILS/0/SD_ILS:189368 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Hornbogen, Erhard. author.&#160;Skrotzki, Birgit. author.&#160;SpringerLink (Online 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C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:166500 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Hawkes, Peter W. editor.&#160;Spence, John C. 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R. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-37590-2">http://dx.doi.org/10.1007/0-387-37590-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Neutron and X-ray Spectroscopy ent://SD_ILS/0/SD_ILS:168875 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Hippert, Fran&ccedil;oise. editor.&#160;Geissler, Erik. editor.&#160;Hodeau, Jean Louis. editor.&#160;Leli&egrave;vre-Berna, Eddy. editor.&#160;Regnard, Jean-Ren&eacute;. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-3337-0">http://dx.doi.org/10.1007/1-4020-3337-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Surface-Enhanced Raman Scattering Physics and Applications ent://SD_ILS/0/SD_ILS:183772 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Kneipp, Katrin. editor.&#160;Moskovits, Martin. editor.&#160;Kneipp, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-33567-6">http://dx.doi.org/10.1007/3-540-33567-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials for Information Technology Devices, Interconnects and Packaging ent://SD_ILS/0/SD_ILS:175333 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Zschech, Ehrenfried. editor.&#160;Whelan, Caroline. editor.&#160;Mikolajick, Thomas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice ent://SD_ILS/0/SD_ILS:164892 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Giannuzzi, Lucille A. editor.&#160;Stevie, Fred A. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b101190">http://dx.doi.org/10.1007/b101190</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thin Films and Heterostructures for Oxide Electronics ent://SD_ILS/0/SD_ILS:165225 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Ogale, Satischandra B. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spectroscopic Properties of Rare Earths in Optical Materials ent://SD_ILS/0/SD_ILS:181676 2024-12-04T09:35:02Z 2024-12-04T09:35:02Z Author&#160;Hull, Robert. editor.&#160;Parisi, J&uuml;rgen. editor.&#160;Osgood, R. 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