Search Results for Particles (Nuclear physics). - Narrowed by: 2006 - Nanotechnology. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dParticles$002b$002528Nuclear$002bphysics$002529.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092006$0025092006$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ps$003d300? 2024-08-25T02:13:58Z Applied Scanning Probe Methods III Characterization ent://SD_ILS/0/SD_ILS:181079 2024-08-25T02:13:58Z 2024-08-25T02:13:58Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IV Industrial Applications ent://SD_ILS/0/SD_ILS:181082 2024-08-25T02:13:58Z 2024-08-25T02:13:58Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Magnetism From Fundamentals to Nanoscale Dynamics ent://SD_ILS/0/SD_ILS:182286 2024-08-25T02:13:58Z 2024-08-25T02:13:58Z Author&#160;St&ouml;hr, Joachim. author.&#160;Siegmann, Hans Christoph. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-30283-4">http://dx.doi.org/10.1007/978-3-540-30283-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents ent://SD_ILS/0/SD_ILS:166196 2024-08-25T02:13:58Z 2024-08-25T02:13:58Z Author&#160;Foster, Adam. author.&#160;Hofer, Werner. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoscale Transistors Device Physics, Modeling and Simulation ent://SD_ILS/0/SD_ILS:165457 2024-08-25T02:13:58Z 2024-08-25T02:13:58Z Author&#160;Lundstrom, Mark S. author.&#160;Guo, Jing. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:181412 2024-08-25T02:13:58Z 2024-08-25T02:13:58Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Surface-Enhanced Raman Scattering Physics and Applications ent://SD_ILS/0/SD_ILS:183772 2024-08-25T02:13:58Z 2024-08-25T02:13:58Z Author&#160;Kneipp, Katrin. editor.&#160;Moskovits, Martin. editor.&#160;Kneipp, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-33567-6">http://dx.doi.org/10.1007/3-540-33567-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>