Search Results for Particles (Nuclear physics). - Narrowed by: 2006 - Nanotechnology.
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2024-08-25T02:13:58Z
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
2024-08-25T02:13:58Z
2024-08-25T02:13:58Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-08-25T02:13:58Z
2024-08-25T02:13:58Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Magnetism From Fundamentals to Nanoscale Dynamics
ent://SD_ILS/0/SD_ILS:182286
2024-08-25T02:13:58Z
2024-08-25T02:13:58Z
Author Stöhr, Joachim. author. Siegmann, Hans Christoph. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-30283-4">http://dx.doi.org/10.1007/978-3-540-30283-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-08-25T02:13:58Z
2024-08-25T02:13:58Z
Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanoscale Transistors Device Physics, Modeling and Simulation
ent://SD_ILS/0/SD_ILS:165457
2024-08-25T02:13:58Z
2024-08-25T02:13:58Z
Author Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-08-25T02:13:58Z
2024-08-25T02:13:58Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Surface-Enhanced Raman Scattering Physics and Applications
ent://SD_ILS/0/SD_ILS:183772
2024-08-25T02:13:58Z
2024-08-25T02:13:58Z
Author Kneipp, Katrin. editor. Moskovits, Martin. editor. Kneipp, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-33567-6">http://dx.doi.org/10.1007/3-540-33567-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>