Search Results for Particles (Nuclear physics). - Narrowed by: Chemistry. - Condensed matter.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dParticles$002b$002528Nuclear$002bphysics$002529.$0026qf$003dSUBJECT$002509Subject$002509Chemistry.$002509Chemistry.$0026qf$003dSUBJECT$002509Subject$002509Condensed$002bmatter.$002509Condensed$002bmatter.$0026ps$003d300?2024-08-24T14:47:13ZFundamentals of Nanoscale Film Analysisent://SD_ILS/0/SD_ILS:1656232024-08-24T14:47:13Z2024-08-24T14:47:13ZAuthor Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Science of Microscopyent://SD_ILS/0/SD_ILS:1665002024-08-24T14:47:13Z2024-08-24T14:47:13ZAuthor Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nanoscale Transistors Device Physics, Modeling and Simulationent://SD_ILS/0/SD_ILS:1654572024-08-24T14:47:13Z2024-08-24T14:47:13ZAuthor Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of Practical X-Ray Fluorescence Analysisent://SD_ILS/0/SD_ILS:1844192024-08-24T14:47:13Z2024-08-24T14:47:13ZAuthor Beckhoff, Burkhard. editor. Kanngießer, habil. Birgit. editor. Langhoff, Norbert. editor. Wedell, Reiner. editor. Wolff, Helmut. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-36722-2">http://dx.doi.org/10.1007/978-3-540-36722-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Thin Films and Heterostructures for Oxide Electronicsent://SD_ILS/0/SD_ILS:1652252024-08-24T14:47:13Z2024-08-24T14:47:13ZAuthor Ogale, Satischandra B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of Powder Diffraction and Structural Characterization of Materialsent://SD_ILS/0/SD_ILS:1650652024-08-24T14:47:13Z2024-08-24T14:47:13ZAuthor Pecharsky, Vitalij K. author. Zavalij, Peter Y. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b106242">http://dx.doi.org/10.1007/b106242</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>