Search Results for Particles (Nuclear physics). - Narrowed by: Chemistry. - Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dParticles$002b$002528Nuclear$002bphysics$002529.$0026qf$003dSUBJECT$002509Subject$002509Chemistry.$002509Chemistry.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ps$003d300?
2024-08-24T09:51:23Z
Solid State Gas Sensing
ent://SD_ILS/0/SD_ILS:164739
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2024-08-24T09:51:23Z
Author Comini, Elisabetta. editor. Faglia, Guido. editor. Sberveglieri, Giorgio. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-09665-0">http://dx.doi.org/10.1007/978-0-387-09665-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:188568
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Nanocrystal Quantum Dots Synthesis, Assembly, Spectroscopy and Applications
ent://SD_ILS/0/SD_ILS:177039
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Rogach, Andrey L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-211-75237-1">http://dx.doi.org/10.1007/978-3-211-75237-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods IX Characterization
ent://SD_ILS/0/SD_ILS:187051
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Tomitori, Masahiko. editor. Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods X Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:187052
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. editor. Tomitori, Masahiko. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of Nanoscale Film Analysis
ent://SD_ILS/0/SD_ILS:165623
2024-08-24T09:51:23Z
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Author Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
ent://SD_ILS/0/SD_ILS:166225
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Lang, Sidney B. author. Chan, Helen L. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38039-1">http://dx.doi.org/10.1007/978-0-387-38039-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
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Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VI Characterization
ent://SD_ILS/0/SD_ILS:184524
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:184525
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Thermotropic Liquid Crystals Recent Advances
ent://SD_ILS/0/SD_ILS:169445
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2024-08-24T09:51:23Z
Author Ramamoorthy, Ayyalusamy. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5354-1">http://dx.doi.org/10.1007/1-4020-5354-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Physics of Zero- and One-Dimensional Nanoscopic Systems
ent://SD_ILS/0/SD_ILS:186608
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2024-08-24T09:51:23Z
Author Karmakar, Sachindra Nath. editor. Maiti, Santanu Kumar. editor. Chowdhury, Jayeeta. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-72632-6">http://dx.doi.org/10.1007/978-3-540-72632-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanoscale Transistors Device Physics, Modeling and Simulation
ent://SD_ILS/0/SD_ILS:165457
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-08-24T09:51:23Z
2024-08-24T09:51:23Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>