Search Results for Particles. - Narrowed by: Chemistry. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dParticles.$0026qf$003dSUBJECT$002509Subject$002509Chemistry.$002509Chemistry.$0026ps$003d300$0026isd$003dtrue? 2024-11-11T07:47:18Z Polymer Particles -/- ent://SD_ILS/0/SD_ILS:182742 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Okubo, Masayoshi. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b14102">http://dx.doi.org/10.1007/b14102</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fine Particles in Medicine and Pharmacy ent://SD_ILS/0/SD_ILS:173668 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Matijevi&#263;, Egon. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0379-1">http://dx.doi.org/10.1007/978-1-4614-0379-1</a><br/>Format:&#160;Electronic 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Author&#160;Comini, Elisabetta. editor.&#160;Faglia, Guido. editor.&#160;Sberveglieri, Giorgio. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-09665-0">http://dx.doi.org/10.1007/978-0-387-09665-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced Batteries Materials Science Aspects ent://SD_ILS/0/SD_ILS:167334 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Huggins, Robert A. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-76424-5">http://dx.doi.org/10.1007/978-0-387-76424-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cryogenic Mixed Refrigerant Processes ent://SD_ILS/0/SD_ILS:167589 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Gadhiraju, Venkatarathnam. author.&#160;Timmerhaus, Klaus D. editor.&#160;Rizzuto, Carlo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-78514-1">http://dx.doi.org/10.1007/978-0-387-78514-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:186997 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Fultz, Brent. author.&#160;Howe, James M. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:187050 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;Tomitori, Masahiko. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IX Characterization ent://SD_ILS/0/SD_ILS:187051 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Tomitori, Masahiko. editor.&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods X Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:187052 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Birgit. editor.&#160;Langhoff, Norbert. editor.&#160;Wedell, Reiner. editor.&#160;Wolff, Helmut. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-36722-2">http://dx.doi.org/10.1007/978-3-540-36722-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods III Characterization ent://SD_ILS/0/SD_ILS:181079 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IV Industrial Applications ent://SD_ILS/0/SD_ILS:181082 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:181412 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Planewaves, Pseudopotentials and the LAPW Method ent://SD_ILS/0/SD_ILS:165667 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Singh, David J. author.&#160;Nordstr&ouml;m, Lars. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29684-5">http://dx.doi.org/10.1007/978-0-387-29684-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoscale Transistors Device Physics, Modeling and Simulation ent://SD_ILS/0/SD_ILS:165457 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Lundstrom, Mark S. author.&#160;Guo, Jing. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11&ndash;14, 2005, Oxford, UK ent://SD_ILS/0/SD_ILS:182995 2024-11-11T07:47:18Z 2024-11-11T07:47:18Z Author&#160;Cullis, A. 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