Search Results for Pattern recognition. - Narrowed by: Skowron, Andrzej. editor. - English - Online Library - Computer science. - Data mining.
SirsiDynix Enterprise
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2024-08-12T12:13:11Z
Rough Set and Knowledge Technology 5th International Conference, RSKT 2010, Beijing, China, October 15-17, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:193234
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Author Yu, Jian. editor. Greco, Salvatore. editor. Lingras, Pawan. editor. Wang, Guoyin. editor. Skowron, Andrzej. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-16248-0">http://dx.doi.org/10.1007/978-3-642-16248-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Rough Sets and Knowledge Technology Third International Conference, RSKT 2008, Chengdu, China, May 17-19, 2008. Proceedings
ent://SD_ILS/0/SD_ILS:188501
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2024-08-12T12:13:11Z
Author Wang, Guoyin. editor. Li, Tianrui. editor. Grzymala-Busse, Jerzy W. editor. Miao, Duoqian. editor. Skowron, Andrzej. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-79721-0">http://dx.doi.org/10.1007/978-3-540-79721-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Rough Sets and Intelligent Systems Paradigms International Conference, RSEISP 2007, Warsaw, Poland, June 28-30, 2007. Proceedings
ent://SD_ILS/0/SD_ILS:186857
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Author Kryszkiewicz, Marzena. editor. Peters, James F. editor. Rybinski, Henryk. editor. Skowron, Andrzej. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73451-2">http://dx.doi.org/10.1007/978-3-540-73451-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>