Search Results for Pecht, Michael. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dPecht$00252C$002bMichael.$0026te$003dILS$0026ps$003d300? 2024-09-13T09:33:15Z Parts selection and management ent://SD_ILS/0/SD_ILS:301730 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Pecht, Michael.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1002/0471723886">Authentication may be required</a> <a href="http://catdir.loc.gov/catdir/bios/wiley046/2004040698.html">Full text available from Wiley InterScience</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/54046845.html">http://catalog.hathitrust.org/api/volumes/oclc/54046845.html</a> John Wiley <a href="http://dx.doi.org/10.1002/0471723886">http://dx.doi.org/10.1002/0471723886</a> Book review (E-STREAMS) <a href="http://www.e-streams.com/es0804/es0804_4027.html">http://www.e-streams.com/es0804/es0804_4027.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Contamination of electronic assemblies ent://SD_ILS/0/SD_ILS:110496 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Pecht, Michael.<br/>Preferred Shelf Number&#160;TK7870.15 C66 2003<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Prognostics and health management of electronics ent://SD_ILS/0/SD_ILS:297392 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Pecht, Michael.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470385845">http://dx.doi.org/10.1002/9780470385845</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=181459&ref=toc">http://www.myilibrary.com?id=181459&ref=toc</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> China's electronics industry the definitive guide for companies and policy makers with interests in China ent://SD_ILS/0/SD_ILS:254859 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Pecht, Michael.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780815515364">http://www.sciencedirect.com/science/book/9780815515364</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead-free electronics ent://SD_ILS/0/SD_ILS:296631 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Ganesan, Sanka.&#160;Pecht, Michael.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://www.contentreserve.com/TitleInfo.asp?ID={A2B1BDDC-EC58-4A31-AD36-1CF319A85670}&Format=50">Click for information</a> John Wiley <a href="http://dx.doi.org/10.1002/047000780X">http://dx.doi.org/10.1002/047000780X</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=34963&ref=toc">http://www.myilibrary.com?id=34963&ref=toc</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Preferred Shelf Number&#160;ONLINE(341870.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Encapsulation technologies for electronic applications ent://SD_ILS/0/SD_ILS:146634 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Ardebili, Haleh.&#160;Pecht, Michael G.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515760">http://www.sciencedirect.com/science/book/9780815515760</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Encapsulation technologies for electronic applications ent://SD_ILS/0/SD_ILS:460352 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Ardebili, Haleh, author.&#160;Zhang, Jiawei, author.&#160;Pecht, Michael, author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128119785">https://www.sciencedirect.com/science/book/9780128119785</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IC component sockets ent://SD_ILS/0/SD_ILS:301581 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Liu, Weifeng.&#160;Pecht, Michael.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471648272">http://dx.doi.org/10.1002/0471648272</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley046/2004043361.html">http://catdir.loc.gov/catdir/bios/wiley046/2004043361.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk-Based Engineering An Integrated Approach to Complex Systems&mdash;Special Reference to Nuclear Plants ent://SD_ILS/0/SD_ILS:400726 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Varde, Prabhakar V. author.&#160;Pecht, Michael G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-13-0090-5">https://doi.org/10.1007/978-981-13-0090-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Copper Wire Bonding ent://SD_ILS/0/SD_ILS:484702 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Chauhan, Preeti S. author.&#160;Choubey, Anupam. author.&#160;Zhong, ZhaoWei. author.&#160;Pecht, Michael G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-5761-9">https://doi.org/10.1007/978-1-4614-5761-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optimum Cooling of Data Centers Application of Risk Assessment and Mitigation Techniques ent://SD_ILS/0/SD_ILS:487185 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Dai, Jun. author.&#160;Ohadi, Michael M. author.&#160;Das, Diganta. author.&#160;Pecht, Michael G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-5602-5">https://doi.org/10.1007/978-1-4614-5602-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Strategies to the Prediction, Mitigation and Management of Product Obsolescence ent://SD_ILS/0/SD_ILS:299292 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Bartels, Bjoern.&#160;Ermel, Ulrich.&#160;Sandborn, Peter A., 1959-&#160;Pecht, Michael.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=832592">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=832592</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118275474">http://dx.doi.org/10.1002/9781118275474</a> Safari Books Online <a href="http://proquest.safaribooksonline.com/?fpi=9781118275467">http://proquest.safaribooksonline.com/?fpi=9781118275467</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=361825&ref=toc">http://www.myilibrary.com?id=361825&ref=toc</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic systems maintenance handbook ent://SD_ILS/0/SD_ILS:286729 2024-09-13T09:33:15Z 2024-09-13T09:33:15Z Author&#160;Whitaker, Jerry C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420036855">Distributed by publisher. 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