Search Results for Physics - Narrowed by: System safety. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dPhysics$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026pe$003dd$00253A$0026ps$003d300?dt=list 2024-12-29T05:15:13Z Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332682.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Nuclear Imperative A Critical Look at the Approaching Energy Crisis (More Physics for Presidents) ent://SD_ILS/0/SD_ILS:205282 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Eerkens, Jeff W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-8667-9">http://dx.doi.org/10.1007/978-90-481-8667-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Suhir, E. editor.&#160;Lee, Y. 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P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nuclear Power and Energy Security ent://SD_ILS/0/SD_ILS:205099 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Apikyan, Samuel A. editor.&#160;Diamond, David J. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3504-2">http://dx.doi.org/10.1007/978-90-481-3504-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance ent://SD_ILS/0/SD_ILS:402462 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Gheorghe, Adrian V. author.&#160;Vamanu, Dan V. author.&#160;Katina, Polinpapilinho F. author.&#160;Pulfer, Roland. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-69224-1">https://doi.org/10.1007/978-3-319-69224-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Homomorphic Encryption and Applications ent://SD_ILS/0/SD_ILS:485761 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Yi, Xun. author.&#160;Paulet, Russell. author.&#160;Bertino, Elisa. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-12229-8">https://doi.org/10.1007/978-3-319-12229-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Risk and Uncertainty in Hydrosystem Engineering ent://SD_ILS/0/SD_ILS:336085 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Goodarzi, Ehsan. author.&#160;Ziaei, Mina. author.&#160;Teang Shui, Lee. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(336085.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-5851-3">http://dx.doi.org/10.1007/978-94-007-5851-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electromigration Modeling at Circuit Layout Level ent://SD_ILS/0/SD_ILS:336507 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Tan, Cher Ming. author.&#160;He, Feifei. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(336507.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-981-4451-21-5">http://dx.doi.org/10.1007/978-981-4451-21-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantitatives Entwicklungsmanagement Modellbasierte Analyse von Produktentwicklungsprozessen ent://SD_ILS/0/SD_ILS:337101 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Hahn, Axel. author.&#160;H&auml;usler, Stefan. author.&#160;gro&szlig;e Austing, Stephan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(337101.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34510-4">http://dx.doi.org/10.1007/978-3-642-34510-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation ent://SD_ILS/0/SD_ILS:330843 2024-12-29T05:15:13Z 2024-12-29T05:15:13Z Author&#160;Sabbagh, Harold A. author.&#160;Murphy, R. 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