Search Results for Physics - Narrowed by: System safety. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dPhysics$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026pe$003dd$00253A$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-30T23:36:22Z Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332682.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Nuclear Imperative A Critical Look at the Approaching Energy Crisis (More Physics for Presidents) ent://SD_ILS/0/SD_ILS:205282 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Eerkens, Jeff W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-8667-9">http://dx.doi.org/10.1007/978-90-481-8667-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Suhir, E. editor.&#160;Lee, Y. C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nuclear Power and Energy Security ent://SD_ILS/0/SD_ILS:205099 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Apikyan, Samuel A. editor.&#160;Diamond, David J. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3504-2">http://dx.doi.org/10.1007/978-90-481-3504-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance ent://SD_ILS/0/SD_ILS:402462 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Gheorghe, Adrian V. author.&#160;Vamanu, Dan V. author.&#160;Katina, Polinpapilinho F. author.&#160;Pulfer, Roland. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-69224-1">https://doi.org/10.1007/978-3-319-69224-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Homomorphic Encryption and Applications ent://SD_ILS/0/SD_ILS:485761 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Yi, Xun. author.&#160;Paulet, Russell. author.&#160;Bertino, Elisa. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-12229-8">https://doi.org/10.1007/978-3-319-12229-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality Management in Reverse Logistics A Broad Look on Quality Issues and Their Interaction with Closed-Loop Supply Chains ent://SD_ILS/0/SD_ILS:331003 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V. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20989-5">http://dx.doi.org/10.1007/978-3-642-20989-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials Proceedings of the IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials, held in Freiberg, Germany, September 1-4, 2009 ent://SD_ILS/0/SD_ILS:205621 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Kuna, Meinhard. editor.&#160;Ricoeur, Andreas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9887-0">http://dx.doi.org/10.1007/978-90-481-9887-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The ELFNET Book on Failure 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author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Particle Size Measurements Fundamentals, Practice, Quality ent://SD_ILS/0/SD_ILS:170410 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Merkus, Henk G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Blast Cleaning Technology ent://SD_ILS/0/SD_ILS:186922 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Momber, Andreas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73645-5">http://dx.doi.org/10.1007/978-3-540-73645-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Self Healing Materials An Alternative Approach to 20 Centuries of Materials Science ent://SD_ILS/0/SD_ILS:169732 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Zwaag, Sybrand. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-6250-6">http://dx.doi.org/10.1007/978-1-4020-6250-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ultrasonic Nondestructive Evaluation Systems Models and Measurements ent://SD_ILS/0/SD_ILS:166454 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Schmerr, Lester W. author.&#160;Song, Sung-Jin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49063-2">http://dx.doi.org/10.1007/978-0-387-49063-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metal Fatigue What It Is, Why It Matters ent://SD_ILS/0/SD_ILS:169533 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Pook, Les. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-5597-3">http://dx.doi.org/10.1007/978-1-4020-5597-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Nuclear Imperative A Critical Look at the Approaching Energy Crisis ent://SD_ILS/0/SD_ILS:169319 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Eerkens, Jeff W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-4931-5">http://dx.doi.org/10.1007/1-4020-4931-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Springer Handbook of Materials Measurement Methods ent://SD_ILS/0/SD_ILS:182291 2024-12-30T23:36:22Z 2024-12-30T23:36:22Z Author&#160;Czichos, Horst. editor.&#160;Saito, Tetsuya. editor.&#160;Smith, Leslie. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-30300-8">http://dx.doi.org/10.1007/978-3-540-30300-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>