Search Results for Physics. - Narrowed by: SpringerLink (Online service) - Online Library - System safety. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dPhysics.$0026qf$003dAUTHOR$002509Author$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue? 2024-08-26T08:15:48Z Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-08-26T08:15:48Z 2024-08-26T08:15:48Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332682.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Nuclear Imperative A Critical Look at the Approaching Energy Crisis (More Physics for Presidents) ent://SD_ILS/0/SD_ILS:205282 2024-08-26T08:15:48Z 2024-08-26T08:15:48Z Author&#160;Eerkens, Jeff W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-8667-9">http://dx.doi.org/10.1007/978-90-481-8667-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-08-26T08:15:48Z 2024-08-26T08:15:48Z Author&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-08-26T08:15:48Z 2024-08-26T08:15:48Z Author&#160;Suhir, E. editor.&#160;Lee, Y. 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Author&#160;Ural, Erdem A. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3372-9">http://dx.doi.org/10.1007/978-1-4614-3372-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects ent://SD_ILS/0/SD_ILS:168463 2024-08-26T08:15:48Z 2024-08-26T08:15:48Z Author&#160;Grossmann, G&uuml;nter. editor.&#160;Zardini, Christian. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Vulnerable Systems ent://SD_ILS/0/SD_ILS:168560 2024-08-26T08:15:48Z 2024-08-26T08:15:48Z Author&#160;Kr&ouml;ger, Wolfgang. 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