Search Results for Process control -- Standards. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dProcess$002bcontrol$002b--$002bStandards.$0026ps$003d300$0026isd$003dtrue? 2026-02-24T23:47:16Z Food product optimization for quality and safety control : process, monitoring, and standards ent://SD_ILS/0/SD_ILS:572970 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Contreras-Esquivel, Juan Carlos, editor.&#160;Badwaik, Laxmikant S., editor.&#160;Kannan, Porteen, editor.&#160;Haghi, A. K., editor.<br/>Preferred Shelf Number&#160;TP372.5 .F657 2021<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003003144">https://www.taylorfrancis.com/books/9781003003144</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Virtual veterinary care and telemedicine ent://SD_ILS/0/SD_ILS:600224 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Roth, Cherice, author.<br/>Preferred Shelf Number&#160;SF745<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394280223">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394280223</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stepping through cybersecurity risk management : a systems thinking approach ent://SD_ILS/0/SD_ILS:599021 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Bayuk, Jennifer L., author.<br/>Preferred Shelf Number&#160;QA76.9 .A25 B39 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394213986">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394213986</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Extended Reality International Conference, XR Salento 2023, Lecce, Italy, September 6-9, 2023, Proceedings, Part I ent://SD_ILS/0/SD_ILS:521124 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;De Paolis, Lucio Tommaso. editor.&#160;Arpaia, Pasquale. editor.&#160;Sacco, Marco. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-43401-3">https://doi.org/10.1007/978-3-031-43401-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Proceedings of CASICAM 2022 ent://SD_ILS/0/SD_ILS:527455 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Zarbane, Khalid. editor.&#160;Beidouri, Zitouni. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-32927-2">https://doi.org/10.1007/978-3-031-32927-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cybersecurity risk management : mastering the fundamentals using the NIST cybersecurity framework ent://SD_ILS/0/SD_ILS:597029 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Brumfield, Cynthia, author.&#160;Haugli, Brian, author.&#160;John Wiley &amp; Sons, publisher.<br/>Preferred Shelf Number&#160;QA76.9 .A25 B82 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119816348">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119816348</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical quality control using Minitab, R, JMP, and Python ent://SD_ILS/0/SD_ILS:596129 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Gupta, Bhisham C., 1942- author.<br/>Preferred Shelf Number&#160;TS156 .Q3 G86 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119671718">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119671718</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Self-service data analytics and governance for managers ent://SD_ILS/0/SD_ILS:596730 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Myers, Nathan E., author.&#160;Kogan, Gregory, author.<br/>Preferred Shelf Number&#160;HF5679 .M89 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119773320">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119773320</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The ESD control program handbook ent://SD_ILS/0/SD_ILS:595961 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Smallwood, J. M. (Jeremy M.), author.<br/>Preferred Shelf Number&#160;TK7870<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modeling and design of secure Internet of things ent://SD_ILS/0/SD_ILS:596119 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Kamhoua, Charles A., editor.&#160;Njilla, Laurent L., editor.&#160;Kott, Alexander, 1971- editor.&#160;Shetty, Sachin, editor.<br/>Preferred Shelf Number&#160;TK5105.8857 .M63 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119593386">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119593386</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The fast close toolkit ent://SD_ILS/0/SD_ILS:595568 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Doxey, Christine H., 1955- author.<br/>Preferred Shelf Number&#160;HF5681 .C45 F37 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119554431">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119554431</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Internal controls toolkit ent://SD_ILS/0/SD_ILS:595312 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Doxey, Christine H., 1955- author.<br/>Preferred Shelf Number&#160;HF5657.4 .D69 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119554424">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119554424</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The road to quality control : the industrial application of statistical quality control ent://SD_ILS/0/SD_ILS:594998 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Sarasohn, Homer, 1916-2001, author.&#160;Fisher, N. I., translator, writer of supplementary textual content.&#160;Tanaka, Y., translator.<br/>Preferred Shelf Number&#160;TS156 .S27 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515012">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515012</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The official (ISC)&sup2; CISSP CBK reference ent://SD_ILS/0/SD_ILS:595207 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Warsinske, John, author.&#160;Graff, Mark, contributor.&#160;Henry, Kevin, contributor.&#160;Hoover, Christopher, contributor.&#160;Malisow, Ben, contributor.<br/>Preferred Shelf Number&#160;TK5105.59<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119423300">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119423300</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering documentation control/configuration management standards manual : policies, procedures, flow diagrams, forms and form instructions for product manufacturing companies ent://SD_ILS/0/SD_ILS:594467 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Watts, Frank B., author.<br/>Preferred Shelf Number&#160;T10.6 .W38 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119479314">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119479314</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Forensic systems engineering : evaluating operations by discovery ent://SD_ILS/0/SD_ILS:593932 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Stimson, William A., author.<br/>Preferred Shelf Number&#160;TA169.5 .S755 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software quality : concepts and practice ent://SD_ILS/0/SD_ILS:594461 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Galin, Daniel, author.<br/>Preferred Shelf Number&#160;QA76.76 .Q35 G35 2018 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119134527">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119134527</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Food and drink--good manufacturing practice : a guide to its responsible management ent://SD_ILS/0/SD_ILS:594466 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Manning, Louise, editor.<br/>Preferred Shelf Number&#160;TP369 .G7<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388494">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388494</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and Reliability in Analytical Chemistry. ent://SD_ILS/0/SD_ILS:540933 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Baiulescu, George E., author.<br/>Preferred Shelf Number&#160;QD75.4 .Q34<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781420038576">https://www.taylorfrancis.com/books/e/9781420038576</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429127441">https://www.taylorfrancis.com/books/e/9780429127441</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429127441">https://www.taylorfrancis.com/books/9780429127441</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Continuous manufacturing of pharmaceuticals ent://SD_ILS/0/SD_ILS:593575 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Kleinebudde, Peter, 1958- editor.&#160;Khinast, Johannes, 1964- editor.&#160;Rantanen, Jukka, editor.<br/>Preferred Shelf Number&#160;RS192 .C67 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119001348">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119001348</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Photovoltaic solar energy : from fundamentals to applications ent://SD_ILS/0/SD_ILS:593310 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Reinders, Ang&egrave;le, editor.&#160;Verlinden, Pierre, editor.&#160;Sark, Wilfried van, editor.&#160;Freundlich, Alexandre, editor.<br/>Preferred Shelf Number&#160;TK1087 .P466 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118927496">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118927496</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The cyber risk handbook : creating and measuring effective cybersecurity capabilities ent://SD_ILS/0/SD_ILS:593609 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Antonucci, Domenic, author.<br/>Preferred Shelf Number&#160;HV6773 .A58 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119309741">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119309741</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The safety critical systems handbook : a straightforward guide to functional safety: IEC 61508 (2010 edition), IEC 61511 (2016 edition) &amp; related guidance, including machinery and other industrial sectors ent://SD_ILS/0/SD_ILS:459040 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Smith, David J. (David John), 1943 June 22- author.&#160;Simpson, Kenneth G. L., author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128051214">http://www.sciencedirect.com/science/book/9780128051214</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk assessment : a practical guide to assessing operational risks ent://SD_ILS/0/SD_ILS:593079 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Popov, Georgi (Engineer), author.&#160;Lyon, Bruce K.&#160;Hollcroft, Bruce.<br/>Preferred Shelf Number&#160;T10.68<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119798323">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119798323</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Driving sustainability to business success : the DS factor-management system integration and automation ent://SD_ILS/0/SD_ILS:342062 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Pilot, Jayne.<br/>Preferred Shelf Number&#160;ONLINE(342062.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/PublicFullRecord.aspx?p=1810505">Click here to view book</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781118356937.jpg">http://catalogimages.wiley.com/images/db/jimages/9781118356937.jpg</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118936733">http://dx.doi.org/10.1002/9781118936733</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{97DD79E9-A497-4924-970A-A4EBEA6F6FBE}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{97DD79E9-A497-4924-970A-A4EBEA6F6FBE}Img100.jpg</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Netcentric system of systems engineering with DEVS unified process ent://SD_ILS/0/SD_ILS:545459 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Mittal, Saurabh., author.&#160;Cetinkaya, Deniz.&#160;Risco-Martin, Jose Luis, 1975-&#160;Seck, Mamadou D.&#160;Verbraeck, Alexander.<br/>Preferred Shelf Number&#160;TA168 .M58 2013<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439827079">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> ISA-95 implementation experiences ent://SD_ILS/0/SD_ILS:280185 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Hawkins, William M., 1938-&#160;Brandl, Dennis.&#160;Boyes, Walt.&#160;World Batch Forum.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=501128">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=501128</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ISA-88 and ISA-95 in the life science industries ent://SD_ILS/0/SD_ILS:280186 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Hawkins, William M., 1938-&#160;Brandl, Dennis.&#160;Boyes, Walt.&#160;World Batch Forum.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=501129">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=501129</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in human factors, ergonomics, and safety in manufacturing and service industries ent://SD_ILS/0/SD_ILS:540071 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Karwowski, Waldemar, 1953-&#160;Salvendy, Gavriel, 1938-<br/>Preferred Shelf Number&#160;TA166 .A383 2011<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439835005">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Applying ISA-88 in discrete and continuous manufacturing ent://SD_ILS/0/SD_ILS:280184 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Hawkins, William.&#160;Brandl, Dennis.&#160;Boyes, Walt.&#160;World Batch Forum.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=501127">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=501127</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety critical systems handbook a straightforward guide to functional safety, IEC 61508 (2010 edition) and related standards ent://SD_ILS/0/SD_ILS:149163 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Smith, David John, 1943-&#160;Simpson, Kenneth G. L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080967813">http://www.sciencedirect.com/science/book/9780080967813</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Information security management handbook ent://SD_ILS/0/SD_ILS:546827 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Tipton, Harold F.&#160;Krause, Micki.<br/>Preferred Shelf Number&#160;QA76.9 .A25 I54165 2007<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420090956">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Fundamentals of quality control and improvement ent://SD_ILS/0/SD_ILS:596773 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Mitra, Amitava.<br/>Preferred Shelf Number&#160;TS156<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692379">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692379</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software configuration management ent://SD_ILS/0/SD_ILS:546264 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Keyes, Jessica, 1950, author.<br/>Preferred Shelf Number&#160;QA76.76 .C69 K49 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135492960">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Information technology control and audit ent://SD_ILS/0/SD_ILS:542229 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Gallegos, Frederick.<br/>Preferred Shelf Number&#160;T58.5 .I5372 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9780203488812">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Instrument engineers' handbook. Process software and digital networks ent://SD_ILS/0/SD_ILS:543767 2026-02-24T23:47:16Z 2026-02-24T23:47:16Z Author&#160;Liptak, Bela G.&#160;Liptak, Bela G. Instrument engineers' handbook. Process measurement and analysis.&#160;Liptak, Bela G. Instrument engineers' handbook. Process control.<br/>Preferred Shelf Number&#160;TS156.8 .I56 2002<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439863442">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/>