Search Results for Process control -- Statistical methods. - Narrowed by: Electronic LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dProcess$002bcontrol$002b--$002bStatistical$002bmethods.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ps$003d300?2025-12-17T00:47:45ZMultivariate Statistical Process Control Process Monitoring Methods and Applicationsent://SD_ILS/0/SD_ILS:3309982025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Ge, Zhiqiang. author. Song, Zhihuan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330998.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4513-4">http://dx.doi.org/10.1007/978-1-4471-4513-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality improvement through planned experimentationent://SD_ILS/0/SD_ILS:2935402025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Moen, Ronald D. Nolan, Thomas W. Provost, Lloyd P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/quality-improvement-through-planned-experimentation-3e">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lean Six sigma statistics calculating process efficiencies in transactional projectsent://SD_ILS/0/SD_ILS:2935732025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Muir, Alastair K. S. (Alastair Kerr S.), 1957-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/lean-six-sigma-statistics">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical process control demystifiedent://SD_ILS/0/SD_ILS:2941092025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Keller, Paul A. (Paul Andrew)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/statistical-process-control-demystified">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical methods for quality improvementent://SD_ILS/0/SD_ILS:2988982025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Ryan, Thomas P., 1945-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118058114">http://dx.doi.org/10.1002/9781118058114</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=43294">http://www.books24x7.com/marc.asp?bookid=43294</a>
<a href="http://resolver.library.cornell.edu/cgi-bin/EBookresolver?set=Books24x7&id=43294">http://resolver.library.cornell.edu/cgi-bin/EBookresolver?set=Books24x7&id=43294</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470590744.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470590744.jpg</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10560653">http://site.ebrary.com/lib/alltitles/Doc?id=10560653</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Schaum's outlines: statistics for engineersent://SD_ILS/0/SD_ILS:2938672025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Stephens, Larry J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/schaums-outline-statistics-for-engineers">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Basic statistical tools for improving qualityent://SD_ILS/0/SD_ILS:3053012025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Kang, Chang W. (Chang Wok), 1957- author. Kvam, Paul H., 1962- author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118491751">http://onlinelibrary.wiley.com/book/10.1002/9781118491751</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118491751">http://dx.doi.org/10.1002/9781118491751</a>
ebrary <a href="http://site.ebrary.com/id/10593130">http://site.ebrary.com/id/10593130</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=1010501">http://swb.eblib.com/patron/FullRecord.aspx?p=1010501</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical analysis of profile monitoringent://SD_ILS/0/SD_ILS:2989242025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Noorossana, Rassoul, 1959- Saghaei, Abbas, 1972- Amiri, Amirhossein, 1979- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118071984">An electronic book accessible through the World Wide Web; click for information</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=45132">http://www.books24x7.com/marc.asp?bookid=45132</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10534036">http://site.ebrary.com/lib/alltitles/Doc?id=10534036</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693512">http://swb.eblib.com/patron/FullRecord.aspx?p=693512</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Industrial statistics practical methods and guidance for improved performanceent://SD_ILS/0/SD_ILS:2978952025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Joglekar, Anand M. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470584149">http://dx.doi.org/10.1002/9780470584149</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical control by monitoring and adjustmentent://SD_ILS/0/SD_ILS:3038252025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Box, George E. P. Luceño, Alberto. Paniagua-Quiñones, María del Carmen.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118164532">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=848509">Click here to view book</a>
ebrary <a href="http://site.ebrary.com/id/10501391">http://site.ebrary.com/id/10501391</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=848509">http://swb.eblib.com/patron/FullRecord.aspx?p=848509</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of semiconductor manufacturing and process controlent://SD_ILS/0/SD_ILS:2494252025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor May, Gary S. Spanos, Costas J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mastering statistical process control a handbook for performance improvement using casesent://SD_ILS/0/SD_ILS:2541892025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Stapenhurst, Tim.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750665292">http://www.sciencedirect.com/science/book/9780750665292</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical methods for six sigma in R & D and manufacturingent://SD_ILS/0/SD_ILS:3016902025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor Joglekar, Anand M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.contentreserve.com/TitleInfo.asp?ID={52501D13-EDE4-4C4D-BEA8-97D1FFA274B0}&Format=50">Click for information</a>
<a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/bios/wiley044/2003003583.html">Full text available from Wiley InterScience</a>
<a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0471721212">Authentication may be required</a>
John Wiley <a href="http://dx.doi.org/10.1002/0471721212">http://dx.doi.org/10.1002/0471721212</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2003003583.html">http://catdir.loc.gov/catdir/bios/wiley044/2003003583.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Guidelines for improving plant reliability through data collection and analysisent://SD_ILS/0/SD_ILS:3000222025-12-17T00:47:45Z2025-12-17T00:47:45ZAuthor American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>