Search Results for Process control. - Narrowed by: 2019SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dProcess$002bcontrol.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092019$0025092019$0026ic$003dtrue$0026ps$003d300?2026-01-23T05:00:39ZNonparametric statistical process controlent://SD_ILS/0/SD_ILS:5946592026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Chakraborti, Subhabrata, author. Graham, Marien A., author.<br/>Preferred Shelf Number QA278.8 .C43 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118890561">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118890561</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Automated stream analysis for process controlent://SD_ILS/0/SD_ILS:2516512026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Manka, Dan P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124690011">http://www.sciencedirect.com/science/book/9780124690011</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124690028">http://www.sciencedirect.com/science/book/9780124690028</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Manufacturing, Production Management and Process Control Joint proceedings of the AHFE 2018 International Conference on Advanced Production Management and Process Control, the AHFE International Conference on Human Aspects of Advanced Manufacturing, and the AHFE International Conference on Additive Manufacturing, Modeling Systems and 3D Prototyping, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USAent://SD_ILS/0/SD_ILS:4868342026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Karwowski, Waldemar. editor. Trzcielinski, Stefan. editor. Mrugalska, Beata. editor. Di Nicolantonio, Massimo. editor. Rossi, Emilio. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-94196-7">https://doi.org/10.1007/978-3-319-94196-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical process control for the food industry : a guide for practitioners and managersent://SD_ILS/0/SD_ILS:5951152026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Lim, Sarina Abdul Halim, author. Antony, Jiju, author.<br/>Preferred Shelf Number TP372.5 .L56 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119152019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119152019</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Security, privacy and digital forensics in the cloudent://SD_ILS/0/SD_ILS:5949342026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Chen, Lei, 1978 July 28- editor. Takabi, Hassan, 1982- editor. Le-Khac, Nhien-An, 1972- editor.<br/>Preferred Shelf Number QA76.585 .S43 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119053385">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119053385</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The road to quality control : the industrial application of statistical quality controlent://SD_ILS/0/SD_ILS:5949982026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Sarasohn, Homer, 1916-2001, author. Fisher, N. I., translator, writer of supplementary textual content. Tanaka, Y., translator.<br/>Preferred Shelf Number TS156 .S27 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515012">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515012</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Operational risk modeling in financial services : the exposure, occurrence, impact methodent://SD_ILS/0/SD_ILS:5950442026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Naïm, Patrick, author. Condamin, Laurent, author.<br/>Preferred Shelf Number HG173 .N35 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119508557">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119508557</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Guidelines for investigating process safety incidentsent://SD_ILS/0/SD_ILS:5952942026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor American Institute of Chemical Engineers. Center for Chemical Process Safety, author.<br/>Preferred Shelf Number TP150 .A23<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529132">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529132</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Internal controls toolkitent://SD_ILS/0/SD_ILS:5953122026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Doxey, Christine H., 1955- author.<br/>Preferred Shelf Number HF5657.4 .D69 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119554424">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119554424</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digitalization of Society and Socio-Political Issues. 1, Digital, Communication, and Cultureent://SD_ILS/0/SD_ILS:5957042026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor George, Éric, 1965-<br/>Preferred Shelf Number T58.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119687177">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119687177</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Predictive control : fundamentals and developmentsent://SD_ILS/0/SD_ILS:5950942026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Xi, Yugeng, 1946- author. Li, Dewei (Computer scientist), author.<br/>Preferred Shelf Number TJ217.6 .X53 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119119593">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119119593</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of 3D integration. Volume 4, Design, test, and thermal managementent://SD_ILS/0/SD_ILS:5950512026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.<br/>Preferred Shelf Number TK7874.893 .H36 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Junctionless Field-Effect Transistors : Design, Modeling, and Simulationent://SD_ILS/0/SD_ILS:5950532026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Sahay, Shubham, author. Kumar, Mamidala Jagadesh, author.<br/>Preferred Shelf Number TK7871.95 .S24 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119523543">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119523543</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Byproducts from agriculture & fisheries : adding value for food, feed, pharma and fuelsent://SD_ILS/0/SD_ILS:5951412026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Simpson, Benjamin K., editor. Aryee, Alberta N. A., 1978- editor. Toldrá, Fidel, editor.<br/>Preferred Shelf Number TD930<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119383956">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119383956</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microgrid planning and design : a concise guideent://SD_ILS/0/SD_ILS:5951552026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Farhangi, Hassan, author. Joós, Géza, author.<br/>Preferred Shelf Number TK3105<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119453550">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119453550</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>MCA Modern Desktop Administrator study guide : Exam MD-100ent://SD_ILS/0/SD_ILS:5954272026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Panek, William, 1970- author.<br/>Preferred Shelf Number QA76.774 .M435<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119605980">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119605980</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Piping and instrumentation diagram developmentent://SD_ILS/0/SD_ILS:5947032026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Toghraei, Moe, 1968- author.<br/>Preferred Shelf Number TP159 .P5 T64 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119329503">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119329503</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Operational risk management : best practices in the financial services industryent://SD_ILS/0/SD_ILS:5949712026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Chapelle, Ariane, author.<br/>Preferred Shelf Number HG173<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119548997">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119548997</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The official (ISC)² CISSP CBK referenceent://SD_ILS/0/SD_ILS:5952072026-01-23T05:00:39Z2026-01-23T05:00:39ZAuthor Warsinske, John, author. Graff, Mark, contributor. Henry, Kevin, contributor. Hoover, Christopher, contributor. Malisow, Ben, contributor.<br/>Preferred Shelf Number TK5105.59<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119423300">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119423300</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>