Search Results for Process control. - Narrowed by: Production management.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dProcess$002bcontrol.$0026qf$003dSUBJECT$002509Subject$002509Production$002bmanagement.$002509Production$002bmanagement.$0026ps$003d300?dt=list2026-06-15T17:13:12ZEconomic Model Predictive Control Theory, Formulations and Chemical Process Applicationsent://SD_ILS/0/SD_ILS:6129702026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor Ellis, Matthew. author. Liu, Jinfeng. author. Christofides, Panagiotis D. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-41108-8">https://doi.org/10.1007/978-3-319-41108-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Manufacturing system throughput excellence : analysis, improvement, and designent://SD_ILS/0/SD_ILS:5990772026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor Tang, He (Herman), author. John Wiley & Sons, publisher.<br/>Preferred Shelf Number TS156.8 .T365 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394190355">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394190355</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Logistics Management Conception and Functionsent://SD_ILS/0/SD_ILS:5267552026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor Pfohl, Hans-Christian. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-66564-0">https://doi.org/10.1007/978-3-662-66564-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Production Processes and Product Evolution in the Age of Disruption Proceedings of the 9th Changeable, Agile, Reconfigurable and Virtual Production Conference (CARV2023) and the 11th World Mass Customization & Personalization Conference (MCPC2023), Bologna, Italy, June 2023ent://SD_ILS/0/SD_ILS:5291202026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor Galizia, Francesco Gabriele. editor. Bortolini, Marco. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-34821-1">https://doi.org/10.1007/978-3-031-34821-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Intelligent and Transformative Production in Pandemic Times Proceedings of the 26th International Conference on Production Researchent://SD_ILS/0/SD_ILS:5288862026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor Huang, Chin-Yin. editor. Dekkers, Rob. editor. Chiu, Shun Fung. editor. Popescu, Daniela. editor. Quezada, Luis. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-18641-7">https://doi.org/10.1007/978-3-031-18641-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Dynamics in Logistics Proceedings of the 5th International Conference LDIC, 2016 Bremen, Germanyent://SD_ILS/0/SD_ILS:6130622026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor Freitag, Michael. editor. Kotzab, Herbert. editor. Pannek, Jürgen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-45117-6">https://doi.org/10.1007/978-3-319-45117-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The handbook of manufacturing engineering. Factory operations : planning and instructional methodsent://SD_ILS/0/SD_ILS:5458362026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor Crowson, Richard.<br/>Preferred Shelf Number TS183 .H3594 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420026955">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:3016722026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor El-Haik, Basem.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50</a>
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John Wiley <a href="http://dx.doi.org/10.1002/0471714682">http://dx.doi.org/10.1002/0471714682</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Run-to-run control in semiconductor manufacturingent://SD_ILS/0/SD_ILS:5474862026-06-15T17:13:12Z2026-06-15T17:13:12ZAuthor Del Castillo, Enrique. Hurwitz, Arnon Max. Moyne, James.<br/>Preferred Shelf Number TK7871.85 .R863 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420040661">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>