Search Results for Protection. - Narrowed by: Electrostatics.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dProtection.$0026qf$003dSUBJECT$002509Subject$002509Electrostatics.$002509Electrostatics.$0026ps$003d300?
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ESD protection methodologies : from component to system
ent://SD_ILS/0/SD_ILS:459666
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Author Bafleur, Marise, author. Caignet, Fabrice, author. Nolhier, Nicolas, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9781785481222">https://www.sciencedirect.com/science/book/9781785481222</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced simulation methods for ESD protection development
ent://SD_ILS/0/SD_ILS:254386
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Author Esmark, Kai. Gossner, Harald. Stadler, Wolfgang.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080441474">http://www.sciencedirect.com/science/book/9780080441474</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD : analog circuits and design
ent://SD_ILS/0/SD_ILS:341679
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Author Voldman, Steven H.<br/>Preferred Shelf Number ONLINE(341679.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118701409">http://dx.doi.org/10.1002/9781118701409</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD basics from semiconductor manufacturing to use
ent://SD_ILS/0/SD_ILS:305212
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Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118443323">An electronic book accessible through the World Wide Web; click for information</a>
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ESD design and synthesis
ent://SD_ILS/0/SD_ILS:305698
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Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119991137">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrostatic discharge understand, simulate and fix ESD problems
ent://SD_ILS/0/SD_ILS:249573
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Author Mardiguian, Michel.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
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Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
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ESD circuits and devices
ent://SD_ILS/0/SD_ILS:295817
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Author Voldman, Steven H. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.contentreserve.com/TitleInfo.asp?ID={4915B268-9738-4E15-8F46-2ACA70C13DF5}&Format=50">Click for information</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470033479">http://dx.doi.org/10.1002/0470033479</a>
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Contamination and ESD control in high technology manufacturing
ent://SD_ILS/0/SD_ILS:249474
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Author Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD RF technology and circuits
ent://SD_ILS/0/SD_ILS:296833
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Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/113386521">http://www3.interscience.wiley.com/cgi-bin/bookhome/113386521</a>
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John Wiley <a href="http://dx.doi.org/10.1002/0470061405">http://dx.doi.org/10.1002/0470061405</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD physics and devices
ent://SD_ILS/0/SD_ILS:295686
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Author Voldman, Steven H.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.contentreserve.com/TitleInfo.asp?ID={9CC18EE6-C13E-4A8A-BCCC-56C81A0D9CC3}&Format=50">Click for information</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470013508">http://dx.doi.org/10.1002/0470013508</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/55138678.html">http://catalog.hathitrust.org/api/volumes/oclc/55138678.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD in silicon integrated circuits
ent://SD_ILS/0/SD_ILS:299953
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Author Amerasekera, E. A. Duvvury, Charvaka, 1944- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470846054">http://dx.doi.org/10.1002/0470846054</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/48109807.html">http://catalog.hathitrust.org/api/volumes/oclc/48109807.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrostatic discharge and electronic equipment a practical guide for designing to prevent ESD problems
ent://SD_ILS/0/SD_ILS:249743
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Author Boxleitner, Warren.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263830">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263830</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>