Search Results for Quality Control - Narrowed by: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dQuality$002bControl$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?
2026-01-24T21:12:21Z
Core-Shell Nanomaterials From Fundamentals to Applications
ent://SD_ILS/0/SD_ILS:600416
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Author Sharma, Shreya. Phogat, Peeyush. Thakur, Jahanvi. Singh, N. L.<br/>Preferred Shelf Number XX(600416.1)<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527855766">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527855766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
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Author Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number TK7874<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Interface engineering in organic field-effect transistors
ent://SD_ILS/0/SD_ILS:598477
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Author Guo, Xuefeng, author. Chen, Hongliang, author.<br/>Preferred Shelf Number QC173.4 .I57 G86 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527840489">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527840489</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The profession of modeling and simulation : discipline, ethics, education, vocation, societies, and economics
ent://SD_ILS/0/SD_ILS:593640
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Author Tolk, Andreas, editor. Ören, Tuncer I., editor.<br/>Preferred Shelf Number QA10.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119288091">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119288091</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sensing Technology: Current Status and Future Trends IV
ent://SD_ILS/0/SD_ILS:529356
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Author Mason, Alex. editor. Mukhopadhyay, Subhas Chandra. editor. Jayasundera, Krishanthi Padmarani. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-12898-6">https://doi.org/10.1007/978-3-319-12898-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Analysis and Simulation of Electrical and Computer Systems
ent://SD_ILS/0/SD_ILS:529698
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Author Gołębiowski, Lesław. editor. Mazur, Damian. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-11248-0">https://doi.org/10.1007/978-3-319-11248-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wearable Electronics Sensors For Safe and Healthy Living
ent://SD_ILS/0/SD_ILS:530601
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Author Mukhopadhyay, Subhas C. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-18191-2">https://doi.org/10.1007/978-3-319-18191-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering
ent://SD_ILS/0/SD_ILS:530615
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Author Sobh, Tarek. editor. Elleithy, Khaled. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06773-5">https://doi.org/10.1007/978-3-319-06773-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
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Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:484755
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Author Grasser, Tibor. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
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Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Decreasing Fuel Consumption and Exhaust Gas Emissions in Transportation Sensing, Control and Reduction of Emissions
ent://SD_ILS/0/SD_ILS:333053
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Author Palocz-Andresen, Michael. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333053.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11976-7">http://dx.doi.org/10.1007/978-3-642-11976-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>