Search Results for Quality Control. - Narrowed by: Electronic circuits.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dQuality$002bControl.$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ic$003dtrue$0026ps$003d300?
2024-09-15T11:31:38Z
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:482935
2024-09-15T11:31:38Z
2024-09-15T11:31:38Z
Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
2024-09-15T11:31:38Z
2024-09-15T11:31:38Z
Author Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:484755
2024-09-15T11:31:38Z
2024-09-15T11:31:38Z
Author Grasser, Tibor. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>