Search Results for Quality Control. - Narrowed by: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dQuality$002bControl.$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300$0026isd$003dtrue?2024-11-07T10:01:33ZFracture mechanics. 1, Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:3054242024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Grous, Ammar, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examplesent://SD_ILS/0/SD_ILS:3650012024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Preferred Shelf Number ONLINE(365001.1)<br/>Electronic Access Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2493822024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Raheja, Dev. Gullo, Louis J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:3649072024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Tobias, Paul A. Trindade, David C.<br/>Preferred Shelf Number TA169 T63 2012<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Design for reliability information and computer-based systemsent://SD_ILS/0/SD_ILS:2498792024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Bauer, Eric.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human reliability, error, and human factors in engineering maintenance with reference to aviation and power generationent://SD_ILS/0/SD_ILS:2868932024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803844">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:2983962024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability technology, human error, and quality in health careent://SD_ILS/0/SD_ILS:2850362024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Maintaining mission critical systems in a 24/7 environmentent://SD_ILS/0/SD_ILS:2494852024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Curtis, Peter M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Guidelines for failure mode and effects analysis for medical devicesent://SD_ILS/0/SD_ILS:2892252024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Dyadem Press.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203490112">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Guidelines for failure mode and effects analysis for automotive, aerospace and general manufacturing industriesent://SD_ILS/0/SD_ILS:2872832024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Dyadem Press.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203009680">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2858862024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Crow, Dana. Feinberg, Alec.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The design analysis handbook a practical guide to design validationent://SD_ILS/0/SD_ILS:2547972024-11-07T10:01:33Z2024-11-07T10:01:33ZAuthor Walker, N. Edward.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>