Search Results for Quality control. - Narrowed by: Computer security. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dQuality$002bcontrol.$0026qf$003dSUBJECT$002509Subject$002509Computer$002bsecurity.$002509Computer$002bsecurity.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list 2026-01-11T17:10:56Z ATTACK-AND-DEFENSE GAMES FOR CONTROL SYSTEMS analysis and synthesis. ent://SD_ILS/0/SD_ILS:576456 2026-01-11T17:10:56Z 2026-01-11T17:10:56Z Author&#160;Yuan, Huanhuan.<br/>Preferred Shelf Number&#160;QA76.9 .A25<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003483250">https://www.taylorfrancis.com/books/9781003483250</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VLSI Design and Test for Systems Dependability ent://SD_ILS/0/SD_ILS:483711 2026-01-11T17:10:56Z 2026-01-11T17:10:56Z Author&#160;Asai, Shojiro. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering ent://SD_ILS/0/SD_ILS:485213 2026-01-11T17:10:56Z 2026-01-11T17:10:56Z Author&#160;Ali, Syed Riffat. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and availability of cloud computing ent://SD_ILS/0/SD_ILS:249383 2026-01-11T17:10:56Z 2026-01-11T17:10:56Z Author&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>