Search Results for Reliability (Engineering) - Narrowed by: 2006 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability$002b$002528Engineering$002529$0026qf$003dPUBDATE$002509Publication$002bDate$0025092006$0025092006$0026ps$003d300? 2025-12-14T23:15:32Z Warranty Management and Product Manufacture ent://SD_ILS/0/SD_ILS:175346 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Murthy, D.N. Prabhakar. author.&#160;Blischke, Wallace R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-258-6">http://dx.doi.org/10.1007/1-84628-258-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Electrical Engineering Handbook - Six Volume Set ent://SD_ILS/0/SD_ILS:542484 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Dorf, Richard C., editor.&#160;Taylor and Francis.<br/>Preferred Shelf Number&#160;R857 .B54<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk analysis in engineering : techniques, tools, and trends ent://SD_ILS/0/SD_ILS:119534 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Modarres, Mohammad.<br/>Preferred Shelf Number&#160;T174.5 M65 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Assurance technologies principles and practices : a product, process, and system safety perspective ent://SD_ILS/0/SD_ILS:295628 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Raheja, Dev.&#160;Allocco, Michael.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=54979&ref=toc">http://www.myilibrary.com?id=54979&ref=toc</a> John Wiley <a href="http://dx.doi.org/10.1002/047000942X">http://dx.doi.org/10.1002/047000942X</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853">http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/62326785.html">http://catalog.hathitrust.org/api/volumes/oclc/62326785.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and risk a Bayesian perspective ent://SD_ILS/0/SD_ILS:296819 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Singpurwalla, Nozer D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintainability, maintenance, and reliability for engineers ent://SD_ILS/0/SD_ILS:545920 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TA168 .D53 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420006780">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> The electrical engineering handbook. Sensors, nanoscience, biomedical engineering, and instruments ent://SD_ILS/0/SD_ILS:547506 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Dorf, Richard C.<br/>Preferred Shelf Number&#160;R857 .B54 E44 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420003161">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> System reliability : concepts and applications ent://SD_ILS/0/SD_ILS:392825 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Klaassen, Klaas B., 1941-&#160;Peppen, Jack C. L. van.<br/>Preferred Shelf Number&#160;QA76.5 K53 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Principles of structural design ent://SD_ILS/0/SD_ILS:546816 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Chen, Wai-Fah, 1936-&#160;Lui, E. M.<br/>Preferred Shelf Number&#160;TA658 .P745 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420037135">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Uncertainty modeling and analysis in engineering and the sciences ent://SD_ILS/0/SD_ILS:544184 2025-12-14T23:15:32Z 2025-12-14T23:15:32Z Author&#160;Ayyub, Bilal M., author.&#160;Klir, George J., 1932-<br/>Preferred Shelf Number&#160;TA330 .A995 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420011456">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/>