Search Results for Reliability (Engineering) - Narrowed by: 2019SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability$002b$002528Engineering$002529$0026qf$003dPUBDATE$002509Publication$002bDate$0025092019$0025092019$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2025-12-11T07:29:10ZNext Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineeringent://SD_ILS/0/SD_ILS:4852132025-12-11T07:29:10Z2025-12-11T07:29:10ZAuthor Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:4829352025-12-11T07:29:10Z2025-12-11T07:29:10ZAuthor McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Technical System Maintenance Delay-Time-Based Modellingent://SD_ILS/0/SD_ILS:4834112025-12-11T07:29:10Z2025-12-11T07:29:10ZAuthor Werbińska-Wojciechowska, Sylwia. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-10788-8">https://doi.org/10.1007/978-3-030-10788-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering Design under Uncertainty and Health Prognosticsent://SD_ILS/0/SD_ILS:4873892025-12-11T07:29:10Z2025-12-11T07:29:10ZAuthor Hu, Chao. author. Youn, Byeng D. author. Wang, Pingfeng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-92574-5">https://doi.org/10.1007/978-3-319-92574-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152025-12-11T07:29:10Z2025-12-11T07:29:10ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112025-12-11T07:29:10Z2025-12-11T07:29:10ZAuthor Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Electrical Engineering Handbook - Six Volume Setent://SD_ILS/0/SD_ILS:5424842025-12-11T07:29:10Z2025-12-11T07:29:10ZAuthor Dorf, Richard C., editor. Taylor and Francis.<br/>Preferred Shelf Number R857 .B54<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>